Small angle x-ray scattering and electron microscopy of nanoparticles formed in an electrical arc

Small Angle X-ray Scattering has been used to characterize nanoparticles generated by electrical arcing between metallic (AgSnO2) electrodes. The particles are found to have diameters between 30 and 40 nm and display smooth surfaces suggesting that they are either in liquid form or have solidified f...

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Main Authors: E. Carvou, J. L. Le Garrec, J. Pérez, J. Praquin, M. Djeddi, J. B. A. Mitchell
Format: Article
Language:English
Published: AIP Publishing LLC 2013-03-01
Series:AIP Advances
Online Access:http://link.aip.org/link/doi/10.1063/1.4799061
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spelling doaj-e59b52bda4c542609f516d3084a4daeb2020-11-24T21:17:18ZengAIP Publishing LLCAIP Advances2158-32262013-03-013303213903213910.1063/1.4799061Small angle x-ray scattering and electron microscopy of nanoparticles formed in an electrical arcE. CarvouJ. L. Le GarrecJ. PérezJ. PraquinM. DjeddiJ. B. A. MitchellSmall Angle X-ray Scattering has been used to characterize nanoparticles generated by electrical arcing between metallic (AgSnO2) electrodes. The particles are found to have diameters between 30 and 40 nm and display smooth surfaces suggesting that they are either in liquid form or have solidified from the liquid state. Particles collected around the electrodes were analyzed by Transmission Electron Microscopy and were seen to be much larger than those seen in the SAXS measurement, to be spherical in form and composed of silver metal with irregular tin oxide particles deposited on their surface. Mixed metal nanoparticles can have important practical applications and the use of mixed sintered electrodes may be a direct method for their production. http://link.aip.org/link/doi/10.1063/1.4799061
collection DOAJ
language English
format Article
sources DOAJ
author E. Carvou
J. L. Le Garrec
J. Pérez
J. Praquin
M. Djeddi
J. B. A. Mitchell
spellingShingle E. Carvou
J. L. Le Garrec
J. Pérez
J. Praquin
M. Djeddi
J. B. A. Mitchell
Small angle x-ray scattering and electron microscopy of nanoparticles formed in an electrical arc
AIP Advances
author_facet E. Carvou
J. L. Le Garrec
J. Pérez
J. Praquin
M. Djeddi
J. B. A. Mitchell
author_sort E. Carvou
title Small angle x-ray scattering and electron microscopy of nanoparticles formed in an electrical arc
title_short Small angle x-ray scattering and electron microscopy of nanoparticles formed in an electrical arc
title_full Small angle x-ray scattering and electron microscopy of nanoparticles formed in an electrical arc
title_fullStr Small angle x-ray scattering and electron microscopy of nanoparticles formed in an electrical arc
title_full_unstemmed Small angle x-ray scattering and electron microscopy of nanoparticles formed in an electrical arc
title_sort small angle x-ray scattering and electron microscopy of nanoparticles formed in an electrical arc
publisher AIP Publishing LLC
series AIP Advances
issn 2158-3226
publishDate 2013-03-01
description Small Angle X-ray Scattering has been used to characterize nanoparticles generated by electrical arcing between metallic (AgSnO2) electrodes. The particles are found to have diameters between 30 and 40 nm and display smooth surfaces suggesting that they are either in liquid form or have solidified from the liquid state. Particles collected around the electrodes were analyzed by Transmission Electron Microscopy and were seen to be much larger than those seen in the SAXS measurement, to be spherical in form and composed of silver metal with irregular tin oxide particles deposited on their surface. Mixed metal nanoparticles can have important practical applications and the use of mixed sintered electrodes may be a direct method for their production.
url http://link.aip.org/link/doi/10.1063/1.4799061
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