Methods for the calibrated measurement of the scattering parameters of planar multi-port devices
In this article, the error-corrected determination of complex scattering parameters of multi-port devices by means of a 2-port vector network analyzer is presented. As only two ports of the device under test can be connected to the analyzer ports at a time, the remaining device ports have to be term...
| Main Authors: | , |
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| Format: | Article |
| Language: | deu |
| Published: |
Copernicus Publications
2007-06-01
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| Series: | Advances in Radio Science |
| Online Access: | http://www.adv-radio-sci.net/5/439/2007/ars-5-439-2007.pdf |