Embedded NDE with piezoelectric wafer-active sensors

• Main Authors: Stevan S. Jovičić, Aleksandar M. Mićović
• Format: Article
• Language: English
• Published: University of Defence in Belgrade 2011-10-01
• Series: Vojnotehnički Glasnik
• Subjects: embedded; wafer-active sensors; Lamb waves; nondestructive evaluation; maintenance
• Online Access: http://scindeks.ceon.rs/article.aspx?artid=0042-84691104248J
• ISSN: 0042-8469; 2217-4753

Emedded nondestructive evaluation (NDE) is an emerging technology that will allow for the transitioning from conventional ultrasonic methods to embedded systems for structural health monitoring (SHM), such as those envisaged for the Integrated Vehicle Health Management (IVHM). Structural health monitoring for IVHM requires the development of small, lightweight, inexpensive systems to be embedded in the airframe with minimum weight penalty and at affordable costs. For non-destructive evaluation, PWASs can be used as both active and passive probes. The main advantage of PWASs over conventional ultrasonic probes lies in their small size, light weight, low profile, and low cost. In spite of their size, these novel devices are able to replicate many of the functions of the conventional ultrasonic probes.