Retrieving the size of particles with rough surfaces from 2D scattering patterns

Retrieving the size of particles with rough surfaces from 2D scattering patterns

Frequency analysis can be used for the recovery of particle properties such as size from scattering data, but is difficult to apply in practice, as lack of completeness or discontinuities at boundaries can produce artifacts. For 2D scattering patterns image processing, including morphological operat...

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Bibliographic Details
Main Authors: Z. Ulanowski, P. H. Kaye, E. Hirst, R. Greenaway
Format: Article
Language:English
Published: Accademia Peloritana dei Pericolanti 2011-09-01
Series:Atti della Accademia Peloritana dei Pericolanti : Classe di Scienze Fisiche, Matematiche e Naturali
Online Access:http://dx.doi.org/10.1478/C1V89S1P087
id doaj-e1e45d88e7724b5da3b9986b0ea148dc
record_format Article
spelling doaj-e1e45d88e7724b5da3b9986b0ea148dc2020-11-24T22:46:40ZengAccademia Peloritana dei PericolantiAtti della Accademia Peloritana dei Pericolanti : Classe di Scienze Fisiche, Matematiche e Naturali0365-03591825-12422011-09-0189S1C1V89S1P087110.1478/C1V89S1P087Retrieving the size of particles with rough surfaces from 2D scattering patternsZ. UlanowskiP. H. KayeE. HirstR. GreenawayFrequency analysis can be used for the recovery of particle properties such as size from scattering data, but is difficult to apply in practice, as lack of completeness or discontinuities at boundaries can produce artifacts. For 2D scattering patterns image processing, including morphological operations, offers an alternative approach. We test possible techniques on a diverse range of particles. It is found that the average surface area of intensity peaks is inversely proportional to particle size. http://dx.doi.org/10.1478/C1V89S1P087
collection DOAJ
language English
format Article
sources DOAJ
author Z. Ulanowski
P. H. Kaye
E. Hirst
R. Greenaway
spellingShingle Z. Ulanowski
P. H. Kaye
E. Hirst
R. Greenaway
Retrieving the size of particles with rough surfaces from 2D scattering patterns
Atti della Accademia Peloritana dei Pericolanti : Classe di Scienze Fisiche, Matematiche e Naturali
author_facet Z. Ulanowski
P. H. Kaye
E. Hirst
R. Greenaway
author_sort Z. Ulanowski
title Retrieving the size of particles with rough surfaces from 2D scattering patterns
title_short Retrieving the size of particles with rough surfaces from 2D scattering patterns
title_full Retrieving the size of particles with rough surfaces from 2D scattering patterns
title_fullStr Retrieving the size of particles with rough surfaces from 2D scattering patterns
title_full_unstemmed Retrieving the size of particles with rough surfaces from 2D scattering patterns
title_sort retrieving the size of particles with rough surfaces from 2d scattering patterns
publisher Accademia Peloritana dei Pericolanti
series Atti della Accademia Peloritana dei Pericolanti : Classe di Scienze Fisiche, Matematiche e Naturali
issn 0365-0359
1825-1242
publishDate 2011-09-01
description Frequency analysis can be used for the recovery of particle properties such as size from scattering data, but is difficult to apply in practice, as lack of completeness or discontinuities at boundaries can produce artifacts. For 2D scattering patterns image processing, including morphological operations, offers an alternative approach. We test possible techniques on a diverse range of particles. It is found that the average surface area of intensity peaks is inversely proportional to particle size.
url http://dx.doi.org/10.1478/C1V89S1P087
work_keys_str_mv AT zulanowski retrievingthesizeofparticleswithroughsurfacesfrom2dscatteringpatterns
AT phkaye retrievingthesizeofparticleswithroughsurfacesfrom2dscatteringpatterns
AT ehirst retrievingthesizeofparticleswithroughsurfacesfrom2dscatteringpatterns
AT rgreenaway retrievingthesizeofparticleswithroughsurfacesfrom2dscatteringpatterns
_version_ 1725684306656886784

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