High-voltage (100 V) ChipfilmTM single-crystal silicon LDMOS transistor for integrated driver circuits in flexible displays

System-in-Foil (SiF) is an emerging field of large-area polymer electronics that employs new materials such as conductive polymers and electrophoretic micro-capsules (E-Ink) along with ultra-thin and thus flexible chips. In flexible displays, the integration of gate and source drivers onto the flexi...

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Main Authors: J. N. Burghartz, H. Richter, A. Asif
Format: Article
Language:deu
Published: Copernicus Publications 2009-05-01
Series:Advances in Radio Science
Online Access:http://www.adv-radio-sci.net/7/237/2009/ars-7-237-2009.pdf
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spelling doaj-e15ae255c3e94fc18e51bbbc0bcf9ee02020-11-24T22:43:31ZdeuCopernicus PublicationsAdvances in Radio Science 1684-99651684-99732009-05-017237242High-voltage (100 V) ChipfilmTM single-crystal silicon LDMOS transistor for integrated driver circuits in flexible displaysJ. N. BurghartzH. RichterA. AsifSystem-in-Foil (SiF) is an emerging field of large-area polymer electronics that employs new materials such as conductive polymers and electrophoretic micro-capsules (E-Ink) along with ultra-thin and thus flexible chips. In flexible displays, the integration of gate and source drivers onto the flexible part increases the yield and enhances the reliability of the system. <br><br> In this work we propose a high-voltage Chipfilm<sup>TM</sup> lateral diffused MOS transistor (LDMOS) structure on ultra-thin single-crystalline silicon chips. The fabrication process is compatible with CMOS standard processing. This LDMOS structure proves to be well suited for providing adequately large switching voltages in spite of the thin (&lt;10 μm) substrate. A breakdown voltage of more than 100 volts with drain-to-source saturation current I<sub><i>ds</i>(sat)</sub>&asymp;85 μA/μm for N-LDMOS and I<sub><i>ds</i>(sat)</sub>&asymp;20 μA/μm for P-LDMOS is predicted through process and device simulations. http://www.adv-radio-sci.net/7/237/2009/ars-7-237-2009.pdf
collection DOAJ
language deu
format Article
sources DOAJ
author J. N. Burghartz
H. Richter
A. Asif
spellingShingle J. N. Burghartz
H. Richter
A. Asif
High-voltage (100 V) ChipfilmTM single-crystal silicon LDMOS transistor for integrated driver circuits in flexible displays
Advances in Radio Science
author_facet J. N. Burghartz
H. Richter
A. Asif
author_sort J. N. Burghartz
title High-voltage (100 V) ChipfilmTM single-crystal silicon LDMOS transistor for integrated driver circuits in flexible displays
title_short High-voltage (100 V) ChipfilmTM single-crystal silicon LDMOS transistor for integrated driver circuits in flexible displays
title_full High-voltage (100 V) ChipfilmTM single-crystal silicon LDMOS transistor for integrated driver circuits in flexible displays
title_fullStr High-voltage (100 V) ChipfilmTM single-crystal silicon LDMOS transistor for integrated driver circuits in flexible displays
title_full_unstemmed High-voltage (100 V) ChipfilmTM single-crystal silicon LDMOS transistor for integrated driver circuits in flexible displays
title_sort high-voltage (100 v) chipfilmtm single-crystal silicon ldmos transistor for integrated driver circuits in flexible displays
publisher Copernicus Publications
series Advances in Radio Science
issn 1684-9965
1684-9973
publishDate 2009-05-01
description System-in-Foil (SiF) is an emerging field of large-area polymer electronics that employs new materials such as conductive polymers and electrophoretic micro-capsules (E-Ink) along with ultra-thin and thus flexible chips. In flexible displays, the integration of gate and source drivers onto the flexible part increases the yield and enhances the reliability of the system. <br><br> In this work we propose a high-voltage Chipfilm<sup>TM</sup> lateral diffused MOS transistor (LDMOS) structure on ultra-thin single-crystalline silicon chips. The fabrication process is compatible with CMOS standard processing. This LDMOS structure proves to be well suited for providing adequately large switching voltages in spite of the thin (&lt;10 μm) substrate. A breakdown voltage of more than 100 volts with drain-to-source saturation current I<sub><i>ds</i>(sat)</sub>&asymp;85 μA/μm for N-LDMOS and I<sub><i>ds</i>(sat)</sub>&asymp;20 μA/μm for P-LDMOS is predicted through process and device simulations.
url http://www.adv-radio-sci.net/7/237/2009/ars-7-237-2009.pdf
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