Tail state mediated conduction in zinc tin oxide thinfilm phototransistors under below bandgap optical excitation
Abstract We report on the appearance of a strong persistent photoconductivity (PPC) and conductor-like behaviour in zinc tin oxide (ZTO) thinfilm phototransistors. The active ZTO channel layer was prepared by remote plasma reactive sputtering and possesses an amorphous structure. Under sub-bandgap e...
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2021-09-01
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Online Access: | https://doi.org/10.1038/s41598-021-98339-4 |
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doaj-e13187abd71a463dad0e4e576bcde9012021-09-26T11:27:10ZengNature Publishing GroupScientific Reports2045-23222021-09-0111111210.1038/s41598-021-98339-4Tail state mediated conduction in zinc tin oxide thinfilm phototransistors under below bandgap optical excitationSoumen Dhara0Kham M. Niang1Andrew J. Flewitt2Arokia Nathan3Stephen A. Lynch4School of Physics and Astronomy, Cardiff UniversityElectrical Engineering Division, Department of Engineering, University of CambridgeElectrical Engineering Division, Department of Engineering, University of CambridgeDarwin College, University of CambridgeSchool of Physics and Astronomy, Cardiff UniversityAbstract We report on the appearance of a strong persistent photoconductivity (PPC) and conductor-like behaviour in zinc tin oxide (ZTO) thinfilm phototransistors. The active ZTO channel layer was prepared by remote plasma reactive sputtering and possesses an amorphous structure. Under sub-bandgap excitation of ZTO with UV light, the photocurrent reaches as high as ~ 10−4 A (a photo-to-dark current ratio of ~ 107) and remains close to this high value after switching off the light. During this time, the ZTO TFT exhibits strong PPC with long-lasting recovery time, which leads the appearance of the conductor-like behaviour in ZTO semiconductor. In the present case, the conductivity changes over six orders of magnitude, from ~ 10−7 to 0.92/Ω/cm. After UV exposure, the ZTO compound can potentially remain in the conducting state for up to a month. The underlying physics of the observed PPC effect is investigated by studying defects (deep states and tail states) by employing a discharge current analysis (DCA) technique. Findings from the DCA study reveal direct evidence for the involvement of sub-bandgap tail states of the ZTO in the strong PPC, while deep states contribute to mild PPC.https://doi.org/10.1038/s41598-021-98339-4 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Soumen Dhara Kham M. Niang Andrew J. Flewitt Arokia Nathan Stephen A. Lynch |
spellingShingle |
Soumen Dhara Kham M. Niang Andrew J. Flewitt Arokia Nathan Stephen A. Lynch Tail state mediated conduction in zinc tin oxide thinfilm phototransistors under below bandgap optical excitation Scientific Reports |
author_facet |
Soumen Dhara Kham M. Niang Andrew J. Flewitt Arokia Nathan Stephen A. Lynch |
author_sort |
Soumen Dhara |
title |
Tail state mediated conduction in zinc tin oxide thinfilm phototransistors under below bandgap optical excitation |
title_short |
Tail state mediated conduction in zinc tin oxide thinfilm phototransistors under below bandgap optical excitation |
title_full |
Tail state mediated conduction in zinc tin oxide thinfilm phototransistors under below bandgap optical excitation |
title_fullStr |
Tail state mediated conduction in zinc tin oxide thinfilm phototransistors under below bandgap optical excitation |
title_full_unstemmed |
Tail state mediated conduction in zinc tin oxide thinfilm phototransistors under below bandgap optical excitation |
title_sort |
tail state mediated conduction in zinc tin oxide thinfilm phototransistors under below bandgap optical excitation |
publisher |
Nature Publishing Group |
series |
Scientific Reports |
issn |
2045-2322 |
publishDate |
2021-09-01 |
description |
Abstract We report on the appearance of a strong persistent photoconductivity (PPC) and conductor-like behaviour in zinc tin oxide (ZTO) thinfilm phototransistors. The active ZTO channel layer was prepared by remote plasma reactive sputtering and possesses an amorphous structure. Under sub-bandgap excitation of ZTO with UV light, the photocurrent reaches as high as ~ 10−4 A (a photo-to-dark current ratio of ~ 107) and remains close to this high value after switching off the light. During this time, the ZTO TFT exhibits strong PPC with long-lasting recovery time, which leads the appearance of the conductor-like behaviour in ZTO semiconductor. In the present case, the conductivity changes over six orders of magnitude, from ~ 10−7 to 0.92/Ω/cm. After UV exposure, the ZTO compound can potentially remain in the conducting state for up to a month. The underlying physics of the observed PPC effect is investigated by studying defects (deep states and tail states) by employing a discharge current analysis (DCA) technique. Findings from the DCA study reveal direct evidence for the involvement of sub-bandgap tail states of the ZTO in the strong PPC, while deep states contribute to mild PPC. |
url |
https://doi.org/10.1038/s41598-021-98339-4 |
work_keys_str_mv |
AT soumendhara tailstatemediatedconductioninzinctinoxidethinfilmphototransistorsunderbelowbandgapopticalexcitation AT khammniang tailstatemediatedconductioninzinctinoxidethinfilmphototransistorsunderbelowbandgapopticalexcitation AT andrewjflewitt tailstatemediatedconductioninzinctinoxidethinfilmphototransistorsunderbelowbandgapopticalexcitation AT arokianathan tailstatemediatedconductioninzinctinoxidethinfilmphototransistorsunderbelowbandgapopticalexcitation AT stephenalynch tailstatemediatedconductioninzinctinoxidethinfilmphototransistorsunderbelowbandgapopticalexcitation |
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