Three Destinies of Solution-Processable Polymer Light-Emitting Diodes under Long-Time Operation
The article describes three different ways of polymer light-emitting diode (PLED) degradation, caused by damage of the protective layer. The electroluminescence and charge-transport properties of a completely encapsulated diode, the diodes with a leaky protective layer and diodes without encapsulati...
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doaj-e0da5489dd004eeea64bccd89c1aadb52021-06-30T23:09:26ZengMDPI AGPolymers2073-43602021-06-01131853185310.3390/polym13111853Three Destinies of Solution-Processable Polymer Light-Emitting Diodes under Long-Time OperationRuslana Udovytska0Pavel Chulkin1Aleksandra Wypych-Puszkarz2Jaroslaw Jung3Department of Molecular Physics, Faculty of Chemistry, Lodz University of Technology, Zeromskiego 116, 90-924 Lodz, PolandFaculty of Chemistry, Silesian University of Technology, Strzody 9 str., 44-100 Gliwice, PolandDepartment of Molecular Physics, Faculty of Chemistry, Lodz University of Technology, Zeromskiego 116, 90-924 Lodz, PolandDepartment of Molecular Physics, Faculty of Chemistry, Lodz University of Technology, Zeromskiego 116, 90-924 Lodz, PolandThe article describes three different ways of polymer light-emitting diode (PLED) degradation, caused by damage of the protective layer. The electroluminescence and charge-transport properties of a completely encapsulated diode, the diodes with a leaky protective layer and diodes without encapsulation were compared under long-time exploitation. The studied devices incorporated Super Yellow light-emitting poly-(1,4-phenylenevinylene) PPV copolymer as an electroluminescence component, and (poly-(3,4-ethylenedioxythiophene)–poly-(styrene sulfonate) (PEDOT:PSS) as a charge-transport layer between the indium tin oxide (ITO) anode and aluminum–calcium cathode. To analyze the PLED degradation mechanism regarding charge transport, impedance spectroscopy was used. The values of resistance and capacitance of the internal layers revealed an effect of applied voltage on charge carrier injection and recombination. The factors responsible for the device degradation were analyzed on a macromolecular level by comparing the plots of voltage dependence of resistance and capacitance at different operation times elapsed.https://www.mdpi.com/2073-4360/13/11/1853polymer light-emitting diodessuper yelloworganic electronicsimpedance spectroscopyequivalent circuit |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Ruslana Udovytska Pavel Chulkin Aleksandra Wypych-Puszkarz Jaroslaw Jung |
spellingShingle |
Ruslana Udovytska Pavel Chulkin Aleksandra Wypych-Puszkarz Jaroslaw Jung Three Destinies of Solution-Processable Polymer Light-Emitting Diodes under Long-Time Operation Polymers polymer light-emitting diodes super yellow organic electronics impedance spectroscopy equivalent circuit |
author_facet |
Ruslana Udovytska Pavel Chulkin Aleksandra Wypych-Puszkarz Jaroslaw Jung |
author_sort |
Ruslana Udovytska |
title |
Three Destinies of Solution-Processable Polymer Light-Emitting Diodes under Long-Time Operation |
title_short |
Three Destinies of Solution-Processable Polymer Light-Emitting Diodes under Long-Time Operation |
title_full |
Three Destinies of Solution-Processable Polymer Light-Emitting Diodes under Long-Time Operation |
title_fullStr |
Three Destinies of Solution-Processable Polymer Light-Emitting Diodes under Long-Time Operation |
title_full_unstemmed |
Three Destinies of Solution-Processable Polymer Light-Emitting Diodes under Long-Time Operation |
title_sort |
three destinies of solution-processable polymer light-emitting diodes under long-time operation |
publisher |
MDPI AG |
series |
Polymers |
issn |
2073-4360 |
publishDate |
2021-06-01 |
description |
The article describes three different ways of polymer light-emitting diode (PLED) degradation, caused by damage of the protective layer. The electroluminescence and charge-transport properties of a completely encapsulated diode, the diodes with a leaky protective layer and diodes without encapsulation were compared under long-time exploitation. The studied devices incorporated Super Yellow light-emitting poly-(1,4-phenylenevinylene) PPV copolymer as an electroluminescence component, and (poly-(3,4-ethylenedioxythiophene)–poly-(styrene sulfonate) (PEDOT:PSS) as a charge-transport layer between the indium tin oxide (ITO) anode and aluminum–calcium cathode. To analyze the PLED degradation mechanism regarding charge transport, impedance spectroscopy was used. The values of resistance and capacitance of the internal layers revealed an effect of applied voltage on charge carrier injection and recombination. The factors responsible for the device degradation were analyzed on a macromolecular level by comparing the plots of voltage dependence of resistance and capacitance at different operation times elapsed. |
topic |
polymer light-emitting diodes super yellow organic electronics impedance spectroscopy equivalent circuit |
url |
https://www.mdpi.com/2073-4360/13/11/1853 |
work_keys_str_mv |
AT ruslanaudovytska threedestiniesofsolutionprocessablepolymerlightemittingdiodesunderlongtimeoperation AT pavelchulkin threedestiniesofsolutionprocessablepolymerlightemittingdiodesunderlongtimeoperation AT aleksandrawypychpuszkarz threedestiniesofsolutionprocessablepolymerlightemittingdiodesunderlongtimeoperation AT jaroslawjung threedestiniesofsolutionprocessablepolymerlightemittingdiodesunderlongtimeoperation |
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