Construction and application of march tests for pattern sensitive memory faults detection
The urgency of the problem of testing storage devices of modern computer systems is shown. The mathematical models of their faults and the methods used for testing the most complex cases by classical march tests are investigated. Passive pattern sensitive faults (PNPSFk) are allocated, in which arbi...
Main Authors: | V. N. Yarmolik, V. A. Levantsevich, D. V. Demenkovets, I. Mrozek |
---|---|
Format: | Article |
Language: | Russian |
Published: |
The United Institute of Informatics Problems of the National Academy of Sciences of Belarus
2021-03-01
|
Series: | Informatika |
Subjects: | |
Online Access: | https://inf.grid.by/jour/article/view/1117 |
Similar Items
-
PSEUDO-EXHAUSTIVE MEMORY DEVICES TESTING BASED ON MULTIPLE MARCH TESTS 1
by: V. N. Yarmolik, et al.
Published: (2018-03-01) -
Transparent memory testing based on dual address sequences
by: V. N. Yarmolik, et al.
Published: (2021-07-01) -
Pseudoexhaustive memory testing based on March A type march tests
by: V. N. Yarmolik, et al.
Published: (2020-06-01) -
Transparent Memory Tests Based on the Double Address Sequences
by: Ireneusz Mrozek, et al.
Published: (2021-07-01) -
Multiple controlled random testing
by: V. A. Levantsevich, et al.
Published: (2019-06-01)