Construction and application of march tests for pattern sensitive memory faults detection

The urgency of the problem of testing storage devices of modern computer systems is shown. The mathematical models of their faults and the methods used for testing the most complex cases by classical march tests are investigated. Passive pattern sensitive faults (PNPSFk) are allocated, in which arbi...

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Main Authors: V. N. Yarmolik, V. A. Levantsevich, D. V. Demenkovets, I. Mrozek
Format: Article
Language:Russian
Published: The United Institute of Informatics Problems of the National Academy of Sciences of Belarus 2021-03-01
Series:Informatika
Subjects:
Online Access:https://inf.grid.by/jour/article/view/1117
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spelling doaj-e0805fd72312442aa4b7fcdb3d9119832021-07-28T21:07:30ZrusThe United Institute of Informatics Problems of the National Academy of Sciences of Belarus Informatika1816-03012021-03-01181254210.37661/1816-0301-2021-18-1-25-42957Construction and application of march tests for pattern sensitive memory faults detectionV. N. Yarmolik0V. A. Levantsevich1D. V. Demenkovets2I. Mrozek3Belarusian State University of Informatics and RadioelectronicsBelarusian State University of Informatics and RadioelectronicsBelarusian State University of Informatics and RadioelectronicsBialystok University of TechnologyThe urgency of the problem of testing storage devices of modern computer systems is shown. The mathematical models of their faults and the methods used for testing the most complex cases by classical march tests are investigated. Passive pattern sensitive faults (PNPSFk) are allocated, in which arbitrary k from N memory cells participate, where k << N, and N is the memory capacity in bits. For these faults, analytical expressions are given for the minimum and maximum fault coverage that is achievable within the march tests. The concept of a primitive is defined, which describes in terms of march test elements the conditions for activation and fault detection of PNPSFk of storage devices. Examples of march tests with maximum fault coverage, as well as march tests with a minimum time complexity equal to 18N are given. The efficiency of a single application of tests such as MATS ++, March C− and March PS is investigated for different number of k ≤ 9 memory cells involved in PNPSFk fault. The applicability of multiple testing with variable address sequences is substantiated, when the use of random sequences of addresses is proposed. Analytical expressions are given for the fault coverage of complex PNPSFk faults depending on the multiplicity of the test. In addition, the estimates of the mean value of the multiplicity of the MATS++, March C− and March PS tests, obtained on the basis of a mathematical model describing the problem of the coupon collector, and ensuring the detection of all k2k PNPSFk faults are given. The validity of analytical estimates is experimentally shown and the high efficiency of PNPSFk fault detection is confirmed by tests of the March PS type.https://inf.grid.by/jour/article/view/1117testing of computer systemsstorage devicesmarch tests of memorymultiple testingcoupon collector problem
collection DOAJ
language Russian
format Article
sources DOAJ
author V. N. Yarmolik
V. A. Levantsevich
D. V. Demenkovets
I. Mrozek
spellingShingle V. N. Yarmolik
V. A. Levantsevich
D. V. Demenkovets
I. Mrozek
Construction and application of march tests for pattern sensitive memory faults detection
Informatika
testing of computer systems
storage devices
march tests of memory
multiple testing
coupon collector problem
author_facet V. N. Yarmolik
V. A. Levantsevich
D. V. Demenkovets
I. Mrozek
author_sort V. N. Yarmolik
title Construction and application of march tests for pattern sensitive memory faults detection
title_short Construction and application of march tests for pattern sensitive memory faults detection
title_full Construction and application of march tests for pattern sensitive memory faults detection
title_fullStr Construction and application of march tests for pattern sensitive memory faults detection
title_full_unstemmed Construction and application of march tests for pattern sensitive memory faults detection
title_sort construction and application of march tests for pattern sensitive memory faults detection
publisher The United Institute of Informatics Problems of the National Academy of Sciences of Belarus
series Informatika
issn 1816-0301
publishDate 2021-03-01
description The urgency of the problem of testing storage devices of modern computer systems is shown. The mathematical models of their faults and the methods used for testing the most complex cases by classical march tests are investigated. Passive pattern sensitive faults (PNPSFk) are allocated, in which arbitrary k from N memory cells participate, where k << N, and N is the memory capacity in bits. For these faults, analytical expressions are given for the minimum and maximum fault coverage that is achievable within the march tests. The concept of a primitive is defined, which describes in terms of march test elements the conditions for activation and fault detection of PNPSFk of storage devices. Examples of march tests with maximum fault coverage, as well as march tests with a minimum time complexity equal to 18N are given. The efficiency of a single application of tests such as MATS ++, March C− and March PS is investigated for different number of k ≤ 9 memory cells involved in PNPSFk fault. The applicability of multiple testing with variable address sequences is substantiated, when the use of random sequences of addresses is proposed. Analytical expressions are given for the fault coverage of complex PNPSFk faults depending on the multiplicity of the test. In addition, the estimates of the mean value of the multiplicity of the MATS++, March C− and March PS tests, obtained on the basis of a mathematical model describing the problem of the coupon collector, and ensuring the detection of all k2k PNPSFk faults are given. The validity of analytical estimates is experimentally shown and the high efficiency of PNPSFk fault detection is confirmed by tests of the March PS type.
topic testing of computer systems
storage devices
march tests of memory
multiple testing
coupon collector problem
url https://inf.grid.by/jour/article/view/1117
work_keys_str_mv AT vnyarmolik constructionandapplicationofmarchtestsforpatternsensitivememoryfaultsdetection
AT valevantsevich constructionandapplicationofmarchtestsforpatternsensitivememoryfaultsdetection
AT dvdemenkovets constructionandapplicationofmarchtestsforpatternsensitivememoryfaultsdetection
AT imrozek constructionandapplicationofmarchtestsforpatternsensitivememoryfaultsdetection
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