Measurement of the quantum defects of 85Rb P and F-series via microwave-assisted electromagnetically induced transparency spectroscopy
We report the measurement of the quantum defects of 85Rb P3/2 and F7/2-series Rydberg levels in a room temperature vapor cell by microwave-assisted electromagnetically induced transparency (EIT) spectroscopy. First, a novel microwave optical three-photon excitation method is employed to obtain the m...
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doaj-df019544f28741d5b33217b977e681ba2021-09-27T04:25:42ZengElsevierResults in Physics2211-37972021-10-0129104728Measurement of the quantum defects of 85Rb P and F-series via microwave-assisted electromagnetically induced transparency spectroscopyShaohua Li0Jinpeng Yuan1Lirong Wang2Liantuan Xiao3Suotang Jia4State Key Laboratory of Quantum Optics and Quantum Optics Devices, Institute of Laser Spectroscopy, Shanxi University, 92 Wucheng Road, Taiyuan 030006, China; Collaborative Innovation Center of Extreme Optics, Shanxi University, 92 Wucheng Road, Taiyuan 030006, ChinaState Key Laboratory of Quantum Optics and Quantum Optics Devices, Institute of Laser Spectroscopy, Shanxi University, 92 Wucheng Road, Taiyuan 030006, China; Collaborative Innovation Center of Extreme Optics, Shanxi University, 92 Wucheng Road, Taiyuan 030006, China; Corresponding authors at: State Key Laboratory of Quantum Optics and Quantum Optics Devices, Institute of Laser Spectroscopy, Shanxi University, 92 Wucheng Road, Taiyuan 030006, China.State Key Laboratory of Quantum Optics and Quantum Optics Devices, Institute of Laser Spectroscopy, Shanxi University, 92 Wucheng Road, Taiyuan 030006, China; Collaborative Innovation Center of Extreme Optics, Shanxi University, 92 Wucheng Road, Taiyuan 030006, China; Corresponding authors at: State Key Laboratory of Quantum Optics and Quantum Optics Devices, Institute of Laser Spectroscopy, Shanxi University, 92 Wucheng Road, Taiyuan 030006, China.State Key Laboratory of Quantum Optics and Quantum Optics Devices, Institute of Laser Spectroscopy, Shanxi University, 92 Wucheng Road, Taiyuan 030006, China; Collaborative Innovation Center of Extreme Optics, Shanxi University, 92 Wucheng Road, Taiyuan 030006, ChinaState Key Laboratory of Quantum Optics and Quantum Optics Devices, Institute of Laser Spectroscopy, Shanxi University, 92 Wucheng Road, Taiyuan 030006, China; Collaborative Innovation Center of Extreme Optics, Shanxi University, 92 Wucheng Road, Taiyuan 030006, ChinaWe report the measurement of the quantum defects of 85Rb P3/2 and F7/2-series Rydberg levels in a room temperature vapor cell by microwave-assisted electromagnetically induced transparency (EIT) spectroscopy. First, a novel microwave optical three-photon excitation method is employed to obtain the microwave-assisted EIT spectroscopy of the 5S1/2 − 5P3/2 – nD5/2 – (n+1)P3/2 or (n-1)F7/2 transition. Next, the Stark shifts of the corresponding Rydberg states relative to the Rabi frequency of microwave field are measured with high accuracy. Finally, the quantum defects, δ0 = 2.64142(15), δ2 = 0.295 for P3/2-series, and δ0 = 0.016411(16), δ2 = -0.0784 for F7/2-series, are forcibly extracted by the modified Rydberg-Ritz formula. This result can serve as a check on advanced theoretical calculations and promote the application of quantum simulations and quantum sensors in atomic ensembles.http://www.sciencedirect.com/science/article/pii/S2211379721008007Microwave-assisted EIT spectroscopyResonant transition frequencyQuantum defect |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Shaohua Li Jinpeng Yuan Lirong Wang Liantuan Xiao Suotang Jia |
spellingShingle |
Shaohua Li Jinpeng Yuan Lirong Wang Liantuan Xiao Suotang Jia Measurement of the quantum defects of 85Rb P and F-series via microwave-assisted electromagnetically induced transparency spectroscopy Results in Physics Microwave-assisted EIT spectroscopy Resonant transition frequency Quantum defect |
author_facet |
Shaohua Li Jinpeng Yuan Lirong Wang Liantuan Xiao Suotang Jia |
author_sort |
Shaohua Li |
title |
Measurement of the quantum defects of 85Rb P and F-series via microwave-assisted electromagnetically induced transparency spectroscopy |
title_short |
Measurement of the quantum defects of 85Rb P and F-series via microwave-assisted electromagnetically induced transparency spectroscopy |
title_full |
Measurement of the quantum defects of 85Rb P and F-series via microwave-assisted electromagnetically induced transparency spectroscopy |
title_fullStr |
Measurement of the quantum defects of 85Rb P and F-series via microwave-assisted electromagnetically induced transparency spectroscopy |
title_full_unstemmed |
Measurement of the quantum defects of 85Rb P and F-series via microwave-assisted electromagnetically induced transparency spectroscopy |
title_sort |
measurement of the quantum defects of 85rb p and f-series via microwave-assisted electromagnetically induced transparency spectroscopy |
publisher |
Elsevier |
series |
Results in Physics |
issn |
2211-3797 |
publishDate |
2021-10-01 |
description |
We report the measurement of the quantum defects of 85Rb P3/2 and F7/2-series Rydberg levels in a room temperature vapor cell by microwave-assisted electromagnetically induced transparency (EIT) spectroscopy. First, a novel microwave optical three-photon excitation method is employed to obtain the microwave-assisted EIT spectroscopy of the 5S1/2 − 5P3/2 – nD5/2 – (n+1)P3/2 or (n-1)F7/2 transition. Next, the Stark shifts of the corresponding Rydberg states relative to the Rabi frequency of microwave field are measured with high accuracy. Finally, the quantum defects, δ0 = 2.64142(15), δ2 = 0.295 for P3/2-series, and δ0 = 0.016411(16), δ2 = -0.0784 for F7/2-series, are forcibly extracted by the modified Rydberg-Ritz formula. This result can serve as a check on advanced theoretical calculations and promote the application of quantum simulations and quantum sensors in atomic ensembles. |
topic |
Microwave-assisted EIT spectroscopy Resonant transition frequency Quantum defect |
url |
http://www.sciencedirect.com/science/article/pii/S2211379721008007 |
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