Determining the Optimal Location and Number of Voltage Dip Monitoring Devices Using the Binary Bat Algorithm

Voltage dips represent a significant power quality problem. The main cause of voltage dips and short-term interruptions is an electrical short circuit that occurs in transmission or distribution networks. Faults in the power system are stochastic by nature and the main cause of voltage dips. As faul...

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Main Authors: Mario Šipoš, Zvonimir Klaić, Emmanuel Karlo Nyarko, Krešimir Fekete
Format: Article
Language:English
Published: MDPI AG 2021-01-01
Series:Energies
Subjects:
Online Access:https://www.mdpi.com/1996-1073/14/1/255
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spelling doaj-debd8caabe924c9384e01ae8885a47f72021-01-06T00:05:22ZengMDPI AGEnergies1996-10732021-01-011425525510.3390/en14010255Determining the Optimal Location and Number of Voltage Dip Monitoring Devices Using the Binary Bat AlgorithmMario Šipoš0Zvonimir Klaić1Emmanuel Karlo Nyarko2Krešimir Fekete3Croatian Military Academy "Dr. Franjo Tudjman", 10000 Zagreb, CroatiaFaculty of Electrical Engineering, Computer Science and Information Technology Osijek, Josip Juraj Stross-mayer University of Osijek, 31000 Osijek, CroatiaFaculty of Electrical Engineering, Computer Science and Information Technology Osijek, Josip Juraj Stross-mayer University of Osijek, 31000 Osijek, CroatiaFaculty of Electrical Engineering, Computer Science and Information Technology Osijek, Josip Juraj Stross-mayer University of Osijek, 31000 Osijek, CroatiaVoltage dips represent a significant power quality problem. The main cause of voltage dips and short-term interruptions is an electrical short circuit that occurs in transmission or distribution networks. Faults in the power system are stochastic by nature and the main cause of voltage dips. As faults in the transmission system can affect more customers than faults in the distribution system, to reduce the number of dips, it is not enough to invest in a small part of the transmission or distribution system. Only targeted investment in the whole (or a large part of the) power system will reduce voltage dips. Therefore, monitoring parts of the power system is very important. The ideal solution would be to cover the entire system so that a power quality (PQ) monitor is installed on each bus, but this method is not economically justified. This paper presents an advanced method for determining the optimal location and the optimal number of voltage dip measuring devices. The proposed algorithm uses a monitor reach area matrix created by short-circuit simulations, and the coefficient of the exposed area. Single-phase and three-phase short circuits are simulated in DIgSILENT software on the IEEE 39 bus test system, using international standard IEC 60909. After determining the monitor reach area matrix of all potential monitor positions, the binary bat algorithm with a coefficient of the exposed area of the system bus is used to minimize the proposed objective function, i.e., to determine the optimal location and number of measuring devices. Performance of the binary bat algorithm is compared to the mixed-integer linear programming algorithm solved by using the GNU Linear Programming Kit (GLPK).https://www.mdpi.com/1996-1073/14/1/255voltage dipPQ monitormonitor reach area matrixbinary bat algorithm
collection DOAJ
language English
format Article
sources DOAJ
author Mario Šipoš
Zvonimir Klaić
Emmanuel Karlo Nyarko
Krešimir Fekete
spellingShingle Mario Šipoš
Zvonimir Klaić
Emmanuel Karlo Nyarko
Krešimir Fekete
Determining the Optimal Location and Number of Voltage Dip Monitoring Devices Using the Binary Bat Algorithm
Energies
voltage dip
PQ monitor
monitor reach area matrix
binary bat algorithm
author_facet Mario Šipoš
Zvonimir Klaić
Emmanuel Karlo Nyarko
Krešimir Fekete
author_sort Mario Šipoš
title Determining the Optimal Location and Number of Voltage Dip Monitoring Devices Using the Binary Bat Algorithm
title_short Determining the Optimal Location and Number of Voltage Dip Monitoring Devices Using the Binary Bat Algorithm
title_full Determining the Optimal Location and Number of Voltage Dip Monitoring Devices Using the Binary Bat Algorithm
title_fullStr Determining the Optimal Location and Number of Voltage Dip Monitoring Devices Using the Binary Bat Algorithm
title_full_unstemmed Determining the Optimal Location and Number of Voltage Dip Monitoring Devices Using the Binary Bat Algorithm
title_sort determining the optimal location and number of voltage dip monitoring devices using the binary bat algorithm
publisher MDPI AG
series Energies
issn 1996-1073
publishDate 2021-01-01
description Voltage dips represent a significant power quality problem. The main cause of voltage dips and short-term interruptions is an electrical short circuit that occurs in transmission or distribution networks. Faults in the power system are stochastic by nature and the main cause of voltage dips. As faults in the transmission system can affect more customers than faults in the distribution system, to reduce the number of dips, it is not enough to invest in a small part of the transmission or distribution system. Only targeted investment in the whole (or a large part of the) power system will reduce voltage dips. Therefore, monitoring parts of the power system is very important. The ideal solution would be to cover the entire system so that a power quality (PQ) monitor is installed on each bus, but this method is not economically justified. This paper presents an advanced method for determining the optimal location and the optimal number of voltage dip measuring devices. The proposed algorithm uses a monitor reach area matrix created by short-circuit simulations, and the coefficient of the exposed area. Single-phase and three-phase short circuits are simulated in DIgSILENT software on the IEEE 39 bus test system, using international standard IEC 60909. After determining the monitor reach area matrix of all potential monitor positions, the binary bat algorithm with a coefficient of the exposed area of the system bus is used to minimize the proposed objective function, i.e., to determine the optimal location and number of measuring devices. Performance of the binary bat algorithm is compared to the mixed-integer linear programming algorithm solved by using the GNU Linear Programming Kit (GLPK).
topic voltage dip
PQ monitor
monitor reach area matrix
binary bat algorithm
url https://www.mdpi.com/1996-1073/14/1/255
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