Approach to detecting latent defects of the printed circuit boards thin-filmed coatings

One of the main reasons for the space vehicles (SV) power supply systems failure is a secondary arc. In the statistics of fatal failures that can lead to the SV loss, the failure rate of the power supply systems is 9%, but despite this, there are no standard methods for diagnosing the on-board equip...

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Main Authors: Balastov Alexey, Kovrigin Boris, Lavrinovich Valery
Format: Article
Language:English
Published: EDP Sciences 2018-01-01
Series:MATEC Web of Conferences
Online Access:https://doi.org/10.1051/matecconf/201819401006
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spelling doaj-de6e5f9eeaa3496aa6362c7ebcbda8152021-04-02T14:45:11ZengEDP SciencesMATEC Web of Conferences2261-236X2018-01-011940100610.1051/matecconf/201819401006matecconf_hmttsc2018_01006Approach to detecting latent defects of the printed circuit boards thin-filmed coatingsBalastov AlexeyKovrigin BorisLavrinovich ValeryOne of the main reasons for the space vehicles (SV) power supply systems failure is a secondary arc. In the statistics of fatal failures that can lead to the SV loss, the failure rate of the power supply systems is 9%, but despite this, there are no standard methods for diagnosing the on-board equipment for the arc stability, due to the relative novelty of the problem. The problem we encountered is associated with the need to switch power supply systems to the voltage levels that are much higher than the arc voltage in the space vacuum. From the point of view of the defects downing that can lead to arcing, the most vulnerable are the insulation coatings. Therefore, a significant part of the problem solution is concentrated in the development of the specific methods for these coatings diagnostics. In space technology, such diagnostics significance is increased due to the inability to provide necessary repairs or services in the outer space.https://doi.org/10.1051/matecconf/201819401006
collection DOAJ
language English
format Article
sources DOAJ
author Balastov Alexey
Kovrigin Boris
Lavrinovich Valery
spellingShingle Balastov Alexey
Kovrigin Boris
Lavrinovich Valery
Approach to detecting latent defects of the printed circuit boards thin-filmed coatings
MATEC Web of Conferences
author_facet Balastov Alexey
Kovrigin Boris
Lavrinovich Valery
author_sort Balastov Alexey
title Approach to detecting latent defects of the printed circuit boards thin-filmed coatings
title_short Approach to detecting latent defects of the printed circuit boards thin-filmed coatings
title_full Approach to detecting latent defects of the printed circuit boards thin-filmed coatings
title_fullStr Approach to detecting latent defects of the printed circuit boards thin-filmed coatings
title_full_unstemmed Approach to detecting latent defects of the printed circuit boards thin-filmed coatings
title_sort approach to detecting latent defects of the printed circuit boards thin-filmed coatings
publisher EDP Sciences
series MATEC Web of Conferences
issn 2261-236X
publishDate 2018-01-01
description One of the main reasons for the space vehicles (SV) power supply systems failure is a secondary arc. In the statistics of fatal failures that can lead to the SV loss, the failure rate of the power supply systems is 9%, but despite this, there are no standard methods for diagnosing the on-board equipment for the arc stability, due to the relative novelty of the problem. The problem we encountered is associated with the need to switch power supply systems to the voltage levels that are much higher than the arc voltage in the space vacuum. From the point of view of the defects downing that can lead to arcing, the most vulnerable are the insulation coatings. Therefore, a significant part of the problem solution is concentrated in the development of the specific methods for these coatings diagnostics. In space technology, such diagnostics significance is increased due to the inability to provide necessary repairs or services in the outer space.
url https://doi.org/10.1051/matecconf/201819401006
work_keys_str_mv AT balastovalexey approachtodetectinglatentdefectsoftheprintedcircuitboardsthinfilmedcoatings
AT kovriginboris approachtodetectinglatentdefectsoftheprintedcircuitboardsthinfilmedcoatings
AT lavrinovichvalery approachtodetectinglatentdefectsoftheprintedcircuitboardsthinfilmedcoatings
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