Intermittent-Contact Heterodyne Force Microscopy
Heterodyne Force Microscopy opens up a way to monitor nanoscale events with high temporal sensitivity from the quasistatic cantilever mechanical-diode response taking advantage of the beat effect. Here, a novel heterodyne ultrasonic force method is proposed, in which the cantilever is driven in ampl...
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| Format: | Article |
| Language: | English |
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Hindawi Limited
2009-01-01
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| Series: | Journal of Nanomaterials |
| Online Access: | http://dx.doi.org/10.1155/2009/762016 |