Robust procedure for creating and characterizing the atomic structure of scanning tunneling microscope tips
Scanning tunneling microscopes (STM) are used extensively for studying and manipulating matter at the atomic scale. In spite of the critical role of the STM tip, procedures for controlling the atomic-scale shape of STM tips have not been rigorously justified. Here, we present a method for preparing...
Main Authors: | Sumit Tewari, Koen M. Bastiaans, Milan P. Allan, Jan M. van Ruitenbeek |
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Format: | Article |
Language: | English |
Published: |
Beilstein-Institut
2017-11-01
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Series: | Beilstein Journal of Nanotechnology |
Subjects: | |
Online Access: | https://doi.org/10.3762/bjnano.8.238 |
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