Remaining useful life prognostic of power metal oxide semiconductor field effect transistor based on improved particle filter algorithm
The power metal oxide semiconductor field effect transistor is used extensively in analog circuits and digital circuits. However, it is also the highest failure rate component in the power electronics system. In order to avoid serious failures in the electrical system, it is necessary to predict the...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
SAGE Publishing
2017-12-01
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| Series: | Advances in Mechanical Engineering |
| Online Access: | https://doi.org/10.1177/1687814017749324 |