Influence of Time-Dependent Power Dissipations on the Ageing Behavior of Thick-Film Resistors
Reliability experiments on hybrid circuits are usually carried out by accelerated ageing test. The circuits or the components under test are stored at an elevated ambient temperature and the change of their electric properties is controlled at regular times. The situation becomes entirely different...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Hindawi Limited
1993-01-01
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| Series: | Active and Passive Electronic Components |
| Online Access: | http://dx.doi.org/10.1155/1993/70852 |