Mechanical/Electrical Characterization of ZnO Nanomaterial Based on AFM/Nanomanipulator Embedded in SEM

Mechanical/Electrical Characterization of ZnO Nanomaterial Based on AFM/Nanomanipulator Embedded in SEM

ZnO nanomaterials have been widely used in micro/nano devices and structure due to special mechanical/electrical properties, and its characterization is still deficient and challenging. In this paper, ZnO nanomaterials, including nanorod and nanowire are characterized by atomic force microscope (AFM...

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Bibliographic Details
Main Authors: Mei Liu, Weilin Su, Xiangzheng Qin, Kai Cheng, Wei Ding, Li Ma, Ze Cui, Jinbo Chen, Jinjun Rao, Hangkong Ouyang, Tao Sun
Format: Article
Language:English
Published: MDPI AG 2021-02-01
Series:Micromachines
Subjects:
nanomanipulator
atomic force microscope
ZnO
mechanical/electrical characterization
piezoelectric property
Online Access:https://www.mdpi.com/2072-666X/12/3/248

Internet

https://www.mdpi.com/2072-666X/12/3/248

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