Statistical Method for Testing of Sigma-Delta Converters

Statistical Method for Testing of Sigma-Delta Converters

Measurement and testing methodology for 2-channel insulated measuring module based S - D on Analog-to-Digital converter AD7710 that has a nominal resolution 16(24) bits is presented. The dependencies of effective resolution on the first notch frequency and gain are given.

Bibliographic Details
Main Authors: J. Vedral, J. Holub
Format: Article
Language:English
Published: CTU Central Library 2000-01-01
Series:Acta Polytechnica
Online Access:https://ojs.cvut.cz/ojs/index.php/ap/article/view/92
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spelling doaj-d9b4c11d850f44f3bc427496eb3d14f32020-11-24T22:10:29ZengCTU Central LibraryActa Polytechnica1210-27091805-23632000-01-0140392Statistical Method for Testing of Sigma-Delta ConvertersJ. VedralJ. HolubMeasurement and testing methodology for 2-channel insulated measuring module based S - D on Analog-to-Digital converter AD7710 that has a nominal resolution 16(24) bits is presented. The dependencies of effective resolution on the first notch frequency and gain are given.https://ojs.cvut.cz/ojs/index.php/ap/article/view/92
collection DOAJ
language English
format Article
sources DOAJ
author J. Vedral
J. Holub
spellingShingle J. Vedral
J. Holub
Statistical Method for Testing of Sigma-Delta Converters
Acta Polytechnica
author_facet J. Vedral
J. Holub
author_sort J. Vedral
title Statistical Method for Testing of Sigma-Delta Converters
title_short Statistical Method for Testing of Sigma-Delta Converters
title_full Statistical Method for Testing of Sigma-Delta Converters
title_fullStr Statistical Method for Testing of Sigma-Delta Converters
title_full_unstemmed Statistical Method for Testing of Sigma-Delta Converters
title_sort statistical method for testing of sigma-delta converters
publisher CTU Central Library
series Acta Polytechnica
issn 1210-2709
1805-2363
publishDate 2000-01-01
description Measurement and testing methodology for 2-channel insulated measuring module based S - D on Analog-to-Digital converter AD7710 that has a nominal resolution 16(24) bits is presented. The dependencies of effective resolution on the first notch frequency and gain are given.
url https://ojs.cvut.cz/ojs/index.php/ap/article/view/92
work_keys_str_mv AT jvedral statisticalmethodfortestingofsigmadeltaconverters
AT jholub statisticalmethodfortestingofsigmadeltaconverters
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