Performance and Transient Behavior of Vertically Integrated Thin-film Silicon Sensors
Vertical integration of amorphous hydrogenated silicon diodes on CMOS readout chips offers several advantages compared to standard CMOS imagers in terms of sensitivity, dynamic range and dark current while at the same time introducing some undesired transient effects leading to image lag. Performanc...
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2008-08-01
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Online Access: | http://www.mdpi.com/1424-8220/8/8/4656/ |
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doaj-d87383c18d954be5b4d1b4b625bfa2492020-11-25T01:03:06ZengMDPI AGSensors1424-82202008-08-018846564668Performance and Transient Behavior of Vertically Integrated Thin-film Silicon SensorsChristophe BallifClément MiazzaGregory ChoongNicolas WyrschVertical integration of amorphous hydrogenated silicon diodes on CMOS readout chips offers several advantages compared to standard CMOS imagers in terms of sensitivity, dynamic range and dark current while at the same time introducing some undesired transient effects leading to image lag. Performance of such sensors is here reported and their transient behaviour is analysed and compared to the one of corresponding amorphous silicon test diodes deposited on glass. The measurements are further compared to simulations for a deeper investigation. The long time constant observed in dark or photocurrent decay is found to be rather independent of the density of defects present in the intrinsic layer of the amorphous silicon diode.http://www.mdpi.com/1424-8220/8/8/4656/Image sensormonolithic integrationamorphous silicon |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Christophe Ballif Clément Miazza Gregory Choong Nicolas Wyrsch |
spellingShingle |
Christophe Ballif Clément Miazza Gregory Choong Nicolas Wyrsch Performance and Transient Behavior of Vertically Integrated Thin-film Silicon Sensors Sensors Image sensor monolithic integration amorphous silicon |
author_facet |
Christophe Ballif Clément Miazza Gregory Choong Nicolas Wyrsch |
author_sort |
Christophe Ballif |
title |
Performance and Transient Behavior of Vertically Integrated Thin-film Silicon Sensors |
title_short |
Performance and Transient Behavior of Vertically Integrated Thin-film Silicon Sensors |
title_full |
Performance and Transient Behavior of Vertically Integrated Thin-film Silicon Sensors |
title_fullStr |
Performance and Transient Behavior of Vertically Integrated Thin-film Silicon Sensors |
title_full_unstemmed |
Performance and Transient Behavior of Vertically Integrated Thin-film Silicon Sensors |
title_sort |
performance and transient behavior of vertically integrated thin-film silicon sensors |
publisher |
MDPI AG |
series |
Sensors |
issn |
1424-8220 |
publishDate |
2008-08-01 |
description |
Vertical integration of amorphous hydrogenated silicon diodes on CMOS readout chips offers several advantages compared to standard CMOS imagers in terms of sensitivity, dynamic range and dark current while at the same time introducing some undesired transient effects leading to image lag. Performance of such sensors is here reported and their transient behaviour is analysed and compared to the one of corresponding amorphous silicon test diodes deposited on glass. The measurements are further compared to simulations for a deeper investigation. The long time constant observed in dark or photocurrent decay is found to be rather independent of the density of defects present in the intrinsic layer of the amorphous silicon diode. |
topic |
Image sensor monolithic integration amorphous silicon |
url |
http://www.mdpi.com/1424-8220/8/8/4656/ |
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