The Zn accumulation behavior, phase evolution and void formation in Sn-xZn/Cu systems by considering trace Zn: a combined experimental and theoretical study

The strong effects of Zn addition on the reaction in Sn/Cu systems are widely known. Nevertheless, the micro-mechanism for Zn accumulation behavior, phase evolution and void formation in Sn-xZn/Cu systems remain unclear. In this work, the effect of Zn addition on the interface behavior is investigat...

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Main Authors: Jieshi Chen, Hongkui Zhang, Peilei Zhang, Zhishui Yu, Yongzhi Zhang, Chun Yu, Hao Lu
Format: Article
Language:English
Published: Elsevier 2019-09-01
Series:Journal of Materials Research and Technology
Online Access:http://www.sciencedirect.com/science/article/pii/S2238785419305915
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spelling doaj-d7ba3c199df642f38469d97806b1e74c2020-11-25T03:41:35ZengElsevierJournal of Materials Research and Technology2238-78542019-09-018541414150The Zn accumulation behavior, phase evolution and void formation in Sn-xZn/Cu systems by considering trace Zn: a combined experimental and theoretical studyJieshi Chen0Hongkui Zhang1Peilei Zhang2Zhishui Yu3Yongzhi Zhang4Chun Yu5Hao Lu6School of Materials Engineering, Shanghai University of Engineering Science, Shanghai 201602, PR China; Shanghai Collaborative Innovation Center of Laser Advanced Manufacturing Technology, Shanghai, 201620, PR China; School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, 200240, PR China; Corresponding authors.School of Materials Engineering, Shanghai University of Engineering Science, Shanghai 201602, PR ChinaSchool of Materials Engineering, Shanghai University of Engineering Science, Shanghai 201602, PR China; Shanghai Collaborative Innovation Center of Laser Advanced Manufacturing Technology, Shanghai, 201620, PR ChinaSchool of Materials Engineering, Shanghai University of Engineering Science, Shanghai 201602, PR China; Shanghai Collaborative Innovation Center of Laser Advanced Manufacturing Technology, Shanghai, 201620, PR ChinaAECC Commercial Aircraft Engine manufacturing CO., TLD, Shanghai 200241, PR ChinaSchool of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, 200240, PR ChinaSchool of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, 200240, PR China; Corresponding authors.The strong effects of Zn addition on the reaction in Sn/Cu systems are widely known. Nevertheless, the micro-mechanism for Zn accumulation behavior, phase evolution and void formation in Sn-xZn/Cu systems remain unclear. In this work, the effect of Zn addition on the interface behavior is investigated. Structures of Sn-xZn/Cu are prepared by the reaction between Sn-xZn solders (x = 0, 0.2, 0.5 and 0.8 wt.%) and the electroplated Cu (EP Cu) joints. During the thermal aging of Sn/EP Cu joints, many voids formed inside the Cu3Sn phase, especially close to the Cu3Sn/EP Cu interface. Whereas the voids were greatly suppressed with Zn addition. During the thermal aging, Zn gradually accumulated near the interface of IMCs/EP Cu. As thermal aging time to168 h and Zn content to 0.8 wt.%, Zn participated in the interface reaction, three layers with different contrasts, (Cu, Zn)6Sn5, Cu6(Sn, Zn)5 and (Cu,Sn)3Zn were formed. Theoretical analysis shows that Zn atom accumulated near the interface of IMCs/EP Cu due to lower diffusion energy barriers (Edf) of Zn than Cu atom. The preferential occupation of Zn atoms in Cu6(Zn,Sn)5 and (Cu,Zn)6Sn5 are Sn3 (4e) and Cu3 (4a) site because of the lowest lattice strain. The diffusion path interstice size for Cu atom via the IMCs layer gradually shrink with the increment of charge transfer in Zn-rich layers, corresponding the Edf of Cu atom gradually rise. As a result, the fluxes of Cu and Sn via the IMCs layer were balanced out, which reduced the Kirkendall voids formation. Keywords: Sn/Cu solder joint, Zinc, Accumulation behavior, Phase evolution, Kirkendall voidhttp://www.sciencedirect.com/science/article/pii/S2238785419305915
collection DOAJ
language English
format Article
sources DOAJ
author Jieshi Chen
Hongkui Zhang
Peilei Zhang
Zhishui Yu
Yongzhi Zhang
Chun Yu
Hao Lu
spellingShingle Jieshi Chen
Hongkui Zhang
Peilei Zhang
Zhishui Yu
Yongzhi Zhang
Chun Yu
Hao Lu
The Zn accumulation behavior, phase evolution and void formation in Sn-xZn/Cu systems by considering trace Zn: a combined experimental and theoretical study
Journal of Materials Research and Technology
author_facet Jieshi Chen
Hongkui Zhang
Peilei Zhang
Zhishui Yu
Yongzhi Zhang
Chun Yu
Hao Lu
author_sort Jieshi Chen
title The Zn accumulation behavior, phase evolution and void formation in Sn-xZn/Cu systems by considering trace Zn: a combined experimental and theoretical study
title_short The Zn accumulation behavior, phase evolution and void formation in Sn-xZn/Cu systems by considering trace Zn: a combined experimental and theoretical study
title_full The Zn accumulation behavior, phase evolution and void formation in Sn-xZn/Cu systems by considering trace Zn: a combined experimental and theoretical study
title_fullStr The Zn accumulation behavior, phase evolution and void formation in Sn-xZn/Cu systems by considering trace Zn: a combined experimental and theoretical study
title_full_unstemmed The Zn accumulation behavior, phase evolution and void formation in Sn-xZn/Cu systems by considering trace Zn: a combined experimental and theoretical study
title_sort zn accumulation behavior, phase evolution and void formation in sn-xzn/cu systems by considering trace zn: a combined experimental and theoretical study
publisher Elsevier
series Journal of Materials Research and Technology
issn 2238-7854
publishDate 2019-09-01
description The strong effects of Zn addition on the reaction in Sn/Cu systems are widely known. Nevertheless, the micro-mechanism for Zn accumulation behavior, phase evolution and void formation in Sn-xZn/Cu systems remain unclear. In this work, the effect of Zn addition on the interface behavior is investigated. Structures of Sn-xZn/Cu are prepared by the reaction between Sn-xZn solders (x = 0, 0.2, 0.5 and 0.8 wt.%) and the electroplated Cu (EP Cu) joints. During the thermal aging of Sn/EP Cu joints, many voids formed inside the Cu3Sn phase, especially close to the Cu3Sn/EP Cu interface. Whereas the voids were greatly suppressed with Zn addition. During the thermal aging, Zn gradually accumulated near the interface of IMCs/EP Cu. As thermal aging time to168 h and Zn content to 0.8 wt.%, Zn participated in the interface reaction, three layers with different contrasts, (Cu, Zn)6Sn5, Cu6(Sn, Zn)5 and (Cu,Sn)3Zn were formed. Theoretical analysis shows that Zn atom accumulated near the interface of IMCs/EP Cu due to lower diffusion energy barriers (Edf) of Zn than Cu atom. The preferential occupation of Zn atoms in Cu6(Zn,Sn)5 and (Cu,Zn)6Sn5 are Sn3 (4e) and Cu3 (4a) site because of the lowest lattice strain. The diffusion path interstice size for Cu atom via the IMCs layer gradually shrink with the increment of charge transfer in Zn-rich layers, corresponding the Edf of Cu atom gradually rise. As a result, the fluxes of Cu and Sn via the IMCs layer were balanced out, which reduced the Kirkendall voids formation. Keywords: Sn/Cu solder joint, Zinc, Accumulation behavior, Phase evolution, Kirkendall void
url http://www.sciencedirect.com/science/article/pii/S2238785419305915
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