A Novel Diagnosis Method for Void Defects in HVDC Mass-Impregnated PPLP Cable Based on Partial Discharge Measurement

• Main Authors: Dong-Hun Oh, Ho-Seung Kim, Bang-Wook Lee
• Format: Article
• Language: English
• Published: MDPI AG 2021-04-01
• Series: Energies
• Subjects: HVDC MI-PPLP cable; DC void discharge; insulation aging; PSA; pattern analysis; insulation diagnosis
• Online Access: https://www.mdpi.com/1996-1073/14/8/2052

Mass Impregnated PPLP cable, which is applied to various high-voltage direct current (HVDC) projects due to its excellent dielectric and temperature properties, has a problem wherein voids are formed inside the butt-gap due to cavitation. However, there has been no previous research into technology for void defect identification and insulation diagnosis on HVDC MI-PPLP cables. In this paper, to propose an insulation diagnosis method for void defects in HVDC MI-PPLP cable, the direct current (DC) void discharge patterns were analyzed according to the specimen temperature and the magnitude of applied voltage using the pulse sequence analysis method. In addition, to confirm the pre-symptoms of dielectric breakdown in MI-PPLP cable due to DC void discharge, partial discharge patterns were analyzed continuously until dielectric breakdown occurred. From the experimental results, DC void discharge patterns of the same shape were obtained regardless of the specimen temperature and the magnitude of applied voltage. In addition, it was confirmed that new insulation aging patterns were generated as electrical and thermal aging occurred due to the continuous DC void discharge. Therefore, it is demonstrated that identification and insulation diagnosis of void defects in HVDC MI-PPLP cable is possible through the obtained DC void discharge and insulation aging patterns.