High-resolution photocurrent microscopy using near-field cathodoluminescence of quantum dots

• Main Authors: Heayoung P. Yoon, Youngmin Lee, Christopher D. Bohn, Seung-Hyeon Ko, Anthony G. Gianfrancesco, Jonathan S. Steckel, Seth Coe-Sullivan, A. Alec Talin, Nikolai B. Zhitenev
• Format: Article
• Language: English
• Published: AIP Publishing LLC 2013-06-01
• Series: AIP Advances
• Online Access: http://link.aip.org/link/doi/10.1063/1.4811275

We report a fast, versatile photocurrent imaging technique to visualize the local photo response of solar energy devices and optoelectronics using near-field cathodoluminescence (CL) from a homogeneous quantum dot layer. This approach is quantitatively compared with direct measurements of high-resolution Electron Beam Induced Current (EBIC) using a thin film solar cell (n-CdS / p-CdTe). Qualitatively, the observed image contrast is similar, showing strong enhancement of the carrier collection efficiency at the p-n junction and near the grain boundaries. The spatial resolution of the new technique, termed Q-EBIC (EBIC using quantum dots), is determined by the absorption depth of photons. The results demonstrate a new method for high-resolution, sub-wavelength photocurrent imaging measurement relevant for a wide range of applications.