<b>Dissipated energy in tapping mode by the atomic force microscope

<b>Dissipated energy in tapping mode by the atomic force microscope

Dissipated energy measurements between a tip of an AFM and a sample have been used to analyze variations in mechanical and tribological properties of materials, using tapping mode AFM to generate topography and phase contrast images. Furthermore it's possible to perform indentations in the mate...

Full description

Bibliographic Details
Main Authors: Gerson Andesron de Carvalho Lopes, Henrique Duarte da Fonseca Filho
Format: Article
Language:English
Published: Universidade Estadual de Maringá 2015-10-01
Series:Acta Scientiarum: Technology
Subjects:
phase contrast
plastic deformations
tip
nanoscale.
Online Access:http://186.233.154.254/ojs/index.php/ActaSciTechnol/article/view/27519

Similar Items

Similar Items