<b>Dissipated energy in tapping mode by the atomic force microscope

<b>Dissipated energy in tapping mode by the atomic force microscope

Dissipated energy measurements between a tip of an AFM and a sample have been used to analyze variations in mechanical and tribological properties of materials, using tapping mode AFM to generate topography and phase contrast images. Furthermore it's possible to perform indentations in the mate...

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Bibliographic Details
Main Authors: Gerson Andesron de Carvalho Lopes, Henrique Duarte da Fonseca Filho
Format: Article
Language:English
Published: Universidade Estadual de Maringá 2015-10-01
Series:Acta Scientiarum: Technology
Subjects:
phase contrast
plastic deformations
tip
nanoscale.
Online Access:http://186.233.154.254/ojs/index.php/ActaSciTechnol/article/view/27519
Description
Summary:Dissipated energy measurements between a tip of an AFM and a sample have been used to analyze variations in mechanical and tribological properties of materials, using tapping mode AFM to generate topography and phase contrast images. Furthermore it's possible to perform indentations in the material with this operation mode and to create micro-controlled defects, in diameter and depth, to growing of quantum dots in semiconductor materials. In this paper, we discuss the fundamentals of this technique.
ISSN:1806-2563
1807-8664

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