Error Assessment and Mitigation Methods in Transient Radar Method

Error Assessment and Mitigation Methods in Transient Radar Method

Transient Radar Method (TRM) was recently proposed as a novel contact-free method for the characterization of multilayer dielectric structures including the geometric details. In this paper, we discuss and quantify the intrinsic and systematic errors of TRM. Also, solutions for mitigating these prob...

Full description

Bibliographic Details
Main Authors: Ali Pourkazemi, Salar Tayebi, Johan H. Stiens
Format: Article
Language:English
Published: MDPI AG 2020-01-01
Series:Sensors
Subjects:
blind method/algorithm
electromagnetic wave
geometric and electromagnetic characteristics
multilayer structures
sub-wavelength thickness measurements
non-destructive testing
non-metallic
lossy-lossy interface
Online Access:https://www.mdpi.com/1424-8220/20/1/263
id doaj-d2789e1d86514685841b2909c3be3847
record_format Article
spelling doaj-d2789e1d86514685841b2909c3be38472020-11-25T02:20:43ZengMDPI AGSensors1424-82202020-01-0120126310.3390/s20010263s20010263Error Assessment and Mitigation Methods in Transient Radar MethodAli Pourkazemi0Salar Tayebi1Johan H. Stiens2Department of Electronics and Informatics, Vrije Universiteit Brussel, Pleinlaan 2, BE-1050 Brussels, BelgiumDepartment of Electronics and Informatics, Vrije Universiteit Brussel, Pleinlaan 2, BE-1050 Brussels, BelgiumDepartment of Electronics and Informatics, Vrije Universiteit Brussel, Pleinlaan 2, BE-1050 Brussels, BelgiumTransient Radar Method (TRM) was recently proposed as a novel contact-free method for the characterization of multilayer dielectric structures including the geometric details. In this paper, we discuss and quantify the intrinsic and systematic errors of TRM. Also, solutions for mitigating these problems are elaborated extensively. The proposed solution for error correction will be applied to quantify experimentally the thickness of several single-layer dielectric structures with thicknesses varying from larger to smaller than the wavelength. We will show how the error correction method allows sub-wavelength thickness measurements around <inline-formula> <math display="inline"> <semantics> <mrow> <mi>&#955;</mi> <mo>/</mo> <mn>5</mn> </mrow> </semantics> </math> </inline-formula>.https://www.mdpi.com/1424-8220/20/1/263blind method/algorithmelectromagnetic wavegeometric and electromagnetic characteristicsmultilayer structuressub-wavelength thickness measurementsnon-destructive testingnon-metalliclossy-lossy interface
collection DOAJ
language English
format Article
sources DOAJ
author Ali Pourkazemi
Salar Tayebi
Johan H. Stiens
spellingShingle Ali Pourkazemi
Salar Tayebi
Johan H. Stiens
Error Assessment and Mitigation Methods in Transient Radar Method
Sensors
blind method/algorithm
electromagnetic wave
geometric and electromagnetic characteristics
multilayer structures
sub-wavelength thickness measurements
non-destructive testing
non-metallic
lossy-lossy interface
author_facet Ali Pourkazemi
Salar Tayebi
Johan H. Stiens
author_sort Ali Pourkazemi
title Error Assessment and Mitigation Methods in Transient Radar Method
title_short Error Assessment and Mitigation Methods in Transient Radar Method
title_full Error Assessment and Mitigation Methods in Transient Radar Method
title_fullStr Error Assessment and Mitigation Methods in Transient Radar Method
title_full_unstemmed Error Assessment and Mitigation Methods in Transient Radar Method
title_sort error assessment and mitigation methods in transient radar method
publisher MDPI AG
series Sensors
issn 1424-8220
publishDate 2020-01-01
description Transient Radar Method (TRM) was recently proposed as a novel contact-free method for the characterization of multilayer dielectric structures including the geometric details. In this paper, we discuss and quantify the intrinsic and systematic errors of TRM. Also, solutions for mitigating these problems are elaborated extensively. The proposed solution for error correction will be applied to quantify experimentally the thickness of several single-layer dielectric structures with thicknesses varying from larger to smaller than the wavelength. We will show how the error correction method allows sub-wavelength thickness measurements around <inline-formula> <math display="inline"> <semantics> <mrow> <mi>&#955;</mi> <mo>/</mo> <mn>5</mn> </mrow> </semantics> </math> </inline-formula>.
topic blind method/algorithm
electromagnetic wave
geometric and electromagnetic characteristics
multilayer structures
sub-wavelength thickness measurements
non-destructive testing
non-metallic
lossy-lossy interface
url https://www.mdpi.com/1424-8220/20/1/263
work_keys_str_mv AT alipourkazemi errorassessmentandmitigationmethodsintransientradarmethod
AT salartayebi errorassessmentandmitigationmethodsintransientradarmethod
AT johanhstiens errorassessmentandmitigationmethodsintransientradarmethod
_version_ 1724870352100655104

Similar Items