Airborne PM2.5 characteristics in semiconductor manufacturing facilities
This study aimed to elucidate the concentrations and physicochemical properties of airborne PM2.5 during the normal operation of process equipment and scrubber in semiconductor manufacturing facilities, including the clean room (CR), plenum, clean sub fab (CSF), and facility sub fab (FSF). Number an...
Main Author: | Kwang-Min Choi |
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Format: | Article |
Language: | English |
Published: |
AIMS Press
2018-07-01
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Series: | AIMS Environmental Science |
Subjects: | |
Online Access: | http://www.aimspress.com/environmental/article/2986/fulltext.html |
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