Robust Gate Driver on Array Based on Amorphous IGZO Thin-Film Transistor for Large Size High-Resolution Liquid Crystal Displays
Amorphous IGZO thin-film transistors (TFTs) in an etch stop layer (ESL) structure was processed on 2500 mm × 2200 mm size substrate. The fabricated devices exhibit enhancement mode characteristics, and excellent uniformity over large area. The presented good operational stabilities under...
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doaj-d1579c6c2941479cae2e0d716cc855222021-04-05T16:57:43ZengIEEEIEEE Journal of the Electron Devices Society2168-67342019-01-01771772110.1109/JEDS.2019.29196778760363Robust Gate Driver on Array Based on Amorphous IGZO Thin-Film Transistor for Large Size High-Resolution Liquid Crystal DisplaysQungang Ma0https://orcid.org/0000-0002-2280-5737Haihong Wang1Liufei Zhou2Jiali Fan3https://orcid.org/0000-0003-2923-0160Congwei Liao4Xiaojun Guo5https://orcid.org/0000-0003-3946-9458Shengdong Zhang6https://orcid.org/0000-0002-1815-8661School of Electronic and Computer Engineering, Peking University Shenzhen Graduate School, Shenzhen, ChinaResearch and Development Center, Nanjing CEC Panda LCD Technology Company Ltd., Nanjing, ChinaResearch and Development Center, Nanjing CEC Panda LCD Technology Company Ltd., Nanjing, ChinaDepartment of Electronic Engineering, School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, ChinaSchool of Electronic and Computer Engineering, Peking University Shenzhen Graduate School, Shenzhen, ChinaDepartment of Electronic Engineering, School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, ChinaSchool of Electronic and Computer Engineering, Peking University Shenzhen Graduate School, Shenzhen, ChinaAmorphous IGZO thin-film transistors (TFTs) in an etch stop layer (ESL) structure was processed on 2500 mm × 2200 mm size substrate. The fabricated devices exhibit enhancement mode characteristics, and excellent uniformity over large area. The presented good operational stabilities under both positive gate bias temperature stress (PBTS) and negative gate bias temperature stress (NBTS) tests can well meet the requirements for pixel switching. However, considering even threshold voltage shift under long term positive bias stress might affect proper operation of the gate driver on array (GOA), a design with a pulse gating scheme is proposed, consisting of 13 TFTs and 1 capacitor, to avoid long term continuous bias stressing of the TFT. With the proposed GOA design, a 32-inch QUHD (7680×4320) highresolution liquid crystal display (LCD) panel with a 7 mm wide bezel is achieved. The reliability of the GOA circuit is well proved through standard aging tests.https://ieeexplore.ieee.org/document/8760363/Thin-film transistorIGZOgate driverstability |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Qungang Ma Haihong Wang Liufei Zhou Jiali Fan Congwei Liao Xiaojun Guo Shengdong Zhang |
spellingShingle |
Qungang Ma Haihong Wang Liufei Zhou Jiali Fan Congwei Liao Xiaojun Guo Shengdong Zhang Robust Gate Driver on Array Based on Amorphous IGZO Thin-Film Transistor for Large Size High-Resolution Liquid Crystal Displays IEEE Journal of the Electron Devices Society Thin-film transistor IGZO gate driver stability |
author_facet |
Qungang Ma Haihong Wang Liufei Zhou Jiali Fan Congwei Liao Xiaojun Guo Shengdong Zhang |
author_sort |
Qungang Ma |
title |
Robust Gate Driver on Array Based on Amorphous IGZO Thin-Film Transistor for Large Size High-Resolution Liquid Crystal Displays |
title_short |
Robust Gate Driver on Array Based on Amorphous IGZO Thin-Film Transistor for Large Size High-Resolution Liquid Crystal Displays |
title_full |
Robust Gate Driver on Array Based on Amorphous IGZO Thin-Film Transistor for Large Size High-Resolution Liquid Crystal Displays |
title_fullStr |
Robust Gate Driver on Array Based on Amorphous IGZO Thin-Film Transistor for Large Size High-Resolution Liquid Crystal Displays |
title_full_unstemmed |
Robust Gate Driver on Array Based on Amorphous IGZO Thin-Film Transistor for Large Size High-Resolution Liquid Crystal Displays |
title_sort |
robust gate driver on array based on amorphous igzo thin-film transistor for large size high-resolution liquid crystal displays |
publisher |
IEEE |
series |
IEEE Journal of the Electron Devices Society |
issn |
2168-6734 |
publishDate |
2019-01-01 |
description |
Amorphous IGZO thin-film transistors (TFTs) in an etch stop layer (ESL) structure was processed on 2500 mm × 2200 mm size substrate. The fabricated devices exhibit enhancement mode characteristics, and excellent uniformity over large area. The presented good operational stabilities under both positive gate bias temperature stress (PBTS) and negative gate bias temperature stress (NBTS) tests can well meet the requirements for pixel switching. However, considering even threshold voltage shift under long term positive bias stress might affect proper operation of the gate driver on array (GOA), a design with a pulse gating scheme is proposed, consisting of 13 TFTs and 1 capacitor, to avoid long term continuous bias stressing of the TFT. With the proposed GOA design, a 32-inch QUHD (7680×4320) highresolution liquid crystal display (LCD) panel with a 7 mm wide bezel is achieved. The reliability of the GOA circuit is well proved through standard aging tests. |
topic |
Thin-film transistor IGZO gate driver stability |
url |
https://ieeexplore.ieee.org/document/8760363/ |
work_keys_str_mv |
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1721540651950014464 |