Zero loop-area Sagnac interferometer at oblique-incidence for detecting in-plane magneto-optic Kerr effect
We describe a zero loop-area Sagnac interferometer at oblique incidence for detecting magneto-optic Kerr effect arising from in-plane magnetization in a sample. By exploiting properties of polarization states under relevant crystal symmetry transformation, we show that...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2017-05-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.4983802 |