Nanotip Contacts for Electric Transport and Field Emission Characterization of Ultrathin MoS<sub>2</sub> Flakes

Nanotip Contacts for Electric Transport and Field Emission Characterization of Ultrathin MoS<sub>2</sub> Flakes

We report a facile approach based on piezoelectric-driven nanotips inside a scanning electron microscope to contact and electrically characterize ultrathin MoS2 (molybdenum disulfide) flakes on a SiO2/Si (silicon dioxide/silicon) substrate. We apply such a method to analyze the electric transport an...

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Bibliographic Details
Main Authors:	Laura Iemmo, Francesca Urban, Filippo Giubileo, Maurizio Passacantando, Antonio Di Bartolomeo
Format:	Article
Language:	English
Published:	MDPI AG 2020-01-01
Series:	Nanomaterials
Subjects:	molybdenum disulfide field effect transistor field emission contacts electric transport
Online Access:	https://www.mdpi.com/2079-4991/10/1/106

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