ACME: A Tool to Improve Configuration Memory Fault Injection in SRAM-Based FPGAs

Circuits in harsh environments, as space, tend to suffer severe problems caused by radiation. In this scenario, where the behavior of the system can be jeopardized, it is critical to produce fault tolerant circuits that can operate correctly. An important task in this scenario is to effectively test...

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Bibliographic Details
Main Authors: Luis Alberto Aranda, Alfonso Sanchez-Macian, Juan Antonio Maestro
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8826250/