Drain Current Modulation of a Single Drain MOSFET by Lorentz Force for Magnetic Sensing Application
This paper reports a detailed analysis of the drain current modulation of a single-drain normal-gate n channel metal-oxide semiconductor field effect transistor (n-MOSFET) under an on-chip magnetic field. A single-drain n-MOSFET has been fabricated and placed in the center of a square-shaped metal l...
Main Authors: | , , |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2016-08-01
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Series: | Sensors |
Subjects: | |
Online Access: | http://www.mdpi.com/1424-8220/16/9/1389 |