Optical investigations of microwave induced synthesis of zinc oxide thin-film

In this article, ZnO thin-film deposition on a glass substrate was done using microwave induced oxygen plasma based CVD system. The prepared thin-films were tested in terms of crystallinity and optical properties by varying the microwave power. The effect of power variation on the morphology and siz...

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Main Authors: Ansari Akhalakur Rahman, Hussain Shahir, Imran Mohd., Al-Ghamdi Attieh A., Chandan Mohammed Rehaan
Format: Article
Language:English
Published: Sciendo 2018-06-01
Series:Materials Science-Poland
Subjects:
zno
xrd
sem
uv
pl
Online Access:https://doi.org/10.1515/msp-2018-0041
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spelling doaj-cb8047ac01154d5f8f8c745bccac803a2021-09-06T19:20:27ZengSciendoMaterials Science-Poland2083-134X2018-06-0136230430910.1515/msp-2018-0041msp-2018-0041Optical investigations of microwave induced synthesis of zinc oxide thin-filmAnsari Akhalakur Rahman0Hussain Shahir1Imran Mohd.2Al-Ghamdi Attieh A.3Chandan Mohammed Rehaan4Centre of Nanotechnology, King Abdulaziz University,Jeddah21589, Saudi ArabiaElectrical Engineering Department, Faculty of Engineering, Jazan University,Jazan45142, Saudi ArabiaChemical Engineering Department, Faculty of Engineering, Jazan University,Jazan45142, Saudi ArabiaCentre of Nanotechnology, King Abdulaziz University,Jeddah21589, Saudi ArabiaChemical Engineering Department, School of Civil and Chemical Engineering, VIT University,Vellore, IndiaIn this article, ZnO thin-film deposition on a glass substrate was done using microwave induced oxygen plasma based CVD system. The prepared thin-films were tested in terms of crystallinity and optical properties by varying the microwave power. The effect of power variation on the morphology and size of final products was carefully investigated. The crystal structure, chemical composition and morphology of the final products were characterized using X-ray diffraction (XRD), scanning electron microscopy (SEM), UV-Vis spectroscopy, Raman spectroscopy and photoluminescence (PL). This technique confirmed the presence of hexagonal ZnO nanocrystals in all the thin-films. The minimum crystallite grain size as obtained from the XRD measurements was ~9.7 nm and the average diameter was ~18 nm.https://doi.org/10.1515/msp-2018-0041znothin filmmicrowave cvdxrdsemuvplraman spectroscopy
collection DOAJ
language English
format Article
sources DOAJ
author Ansari Akhalakur Rahman
Hussain Shahir
Imran Mohd.
Al-Ghamdi Attieh A.
Chandan Mohammed Rehaan
spellingShingle Ansari Akhalakur Rahman
Hussain Shahir
Imran Mohd.
Al-Ghamdi Attieh A.
Chandan Mohammed Rehaan
Optical investigations of microwave induced synthesis of zinc oxide thin-film
Materials Science-Poland
zno
thin film
microwave cvd
xrd
sem
uv
pl
raman spectroscopy
author_facet Ansari Akhalakur Rahman
Hussain Shahir
Imran Mohd.
Al-Ghamdi Attieh A.
Chandan Mohammed Rehaan
author_sort Ansari Akhalakur Rahman
title Optical investigations of microwave induced synthesis of zinc oxide thin-film
title_short Optical investigations of microwave induced synthesis of zinc oxide thin-film
title_full Optical investigations of microwave induced synthesis of zinc oxide thin-film
title_fullStr Optical investigations of microwave induced synthesis of zinc oxide thin-film
title_full_unstemmed Optical investigations of microwave induced synthesis of zinc oxide thin-film
title_sort optical investigations of microwave induced synthesis of zinc oxide thin-film
publisher Sciendo
series Materials Science-Poland
issn 2083-134X
publishDate 2018-06-01
description In this article, ZnO thin-film deposition on a glass substrate was done using microwave induced oxygen plasma based CVD system. The prepared thin-films were tested in terms of crystallinity and optical properties by varying the microwave power. The effect of power variation on the morphology and size of final products was carefully investigated. The crystal structure, chemical composition and morphology of the final products were characterized using X-ray diffraction (XRD), scanning electron microscopy (SEM), UV-Vis spectroscopy, Raman spectroscopy and photoluminescence (PL). This technique confirmed the presence of hexagonal ZnO nanocrystals in all the thin-films. The minimum crystallite grain size as obtained from the XRD measurements was ~9.7 nm and the average diameter was ~18 nm.
topic zno
thin film
microwave cvd
xrd
sem
uv
pl
raman spectroscopy
url https://doi.org/10.1515/msp-2018-0041
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AT hussainshahir opticalinvestigationsofmicrowaveinducedsynthesisofzincoxidethinfilm
AT imranmohd opticalinvestigationsofmicrowaveinducedsynthesisofzincoxidethinfilm
AT alghamdiattieha opticalinvestigationsofmicrowaveinducedsynthesisofzincoxidethinfilm
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