Reliability Analysis of Vertical Cavity Surface-Emitting Lasers Based on the Gamma Process
Due to the long life and high reliability of vertical cavity surface-emitting lasers, the performance degradation experiment cost is high, and the experiment cycle is long, because the degradation failure process of a semiconductor laser is a monotonic decreasing process, and the amount of performan...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2020-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8955903/ |