Thick Film Ni0.5Mn0.5−xSnx Heusler Alloys by Multi-layer Electrochemical Deposition
Abstract The design of multifunctional alloys with multiple chemical components requires controllable synthesis approaches. Physical vapor deposition techniques, which result in thin films (<1 μm), have previously been demonstrated for micromechanical devices and metallic combinatorial libraries....
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2018-08-01
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Online Access: | https://doi.org/10.1038/s41598-018-29628-8 |
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doaj-ca87db80447f4b9a889bd134f55928f52020-12-08T04:57:27ZengNature Publishing GroupScientific Reports2045-23222018-08-018111310.1038/s41598-018-29628-8Thick Film Ni0.5Mn0.5−xSnx Heusler Alloys by Multi-layer Electrochemical DepositionYijia Zhang0Patrick J. Shamberger1Department of Materials Science and Engineering, Texas A&M UniversityDepartment of Materials Science and Engineering, Texas A&M UniversityAbstract The design of multifunctional alloys with multiple chemical components requires controllable synthesis approaches. Physical vapor deposition techniques, which result in thin films (<1 μm), have previously been demonstrated for micromechanical devices and metallic combinatorial libraries. However, this approach deviates from bulk-like properties due to the residual stress derived in thin films and is limited by total film thickness. Here, we report a route to obtain ternary Ni-Mn-Sn alloy thick films with controllable compositions and thicknesses by annealing electrochemically deposited multi-layer monatomic (Ni, Mn, Sn) films, deposited sequentially from separate aqueous deposition baths. We demonstrate (1) controllable compositions, with high degree of uniformity, (2) smooth films, and (3) high reproducibility between film transformation behavior. Our results demonstrate a positive correlation between alloy film thicknesses and grain sizes, as well as consistent bulk-like transformation behavior.https://doi.org/10.1038/s41598-018-29628-8 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Yijia Zhang Patrick J. Shamberger |
spellingShingle |
Yijia Zhang Patrick J. Shamberger Thick Film Ni0.5Mn0.5−xSnx Heusler Alloys by Multi-layer Electrochemical Deposition Scientific Reports |
author_facet |
Yijia Zhang Patrick J. Shamberger |
author_sort |
Yijia Zhang |
title |
Thick Film Ni0.5Mn0.5−xSnx Heusler Alloys by Multi-layer Electrochemical Deposition |
title_short |
Thick Film Ni0.5Mn0.5−xSnx Heusler Alloys by Multi-layer Electrochemical Deposition |
title_full |
Thick Film Ni0.5Mn0.5−xSnx Heusler Alloys by Multi-layer Electrochemical Deposition |
title_fullStr |
Thick Film Ni0.5Mn0.5−xSnx Heusler Alloys by Multi-layer Electrochemical Deposition |
title_full_unstemmed |
Thick Film Ni0.5Mn0.5−xSnx Heusler Alloys by Multi-layer Electrochemical Deposition |
title_sort |
thick film ni0.5mn0.5−xsnx heusler alloys by multi-layer electrochemical deposition |
publisher |
Nature Publishing Group |
series |
Scientific Reports |
issn |
2045-2322 |
publishDate |
2018-08-01 |
description |
Abstract The design of multifunctional alloys with multiple chemical components requires controllable synthesis approaches. Physical vapor deposition techniques, which result in thin films (<1 μm), have previously been demonstrated for micromechanical devices and metallic combinatorial libraries. However, this approach deviates from bulk-like properties due to the residual stress derived in thin films and is limited by total film thickness. Here, we report a route to obtain ternary Ni-Mn-Sn alloy thick films with controllable compositions and thicknesses by annealing electrochemically deposited multi-layer monatomic (Ni, Mn, Sn) films, deposited sequentially from separate aqueous deposition baths. We demonstrate (1) controllable compositions, with high degree of uniformity, (2) smooth films, and (3) high reproducibility between film transformation behavior. Our results demonstrate a positive correlation between alloy film thicknesses and grain sizes, as well as consistent bulk-like transformation behavior. |
url |
https://doi.org/10.1038/s41598-018-29628-8 |
work_keys_str_mv |
AT yijiazhang thickfilmni05mn05xsnxheusleralloysbymultilayerelectrochemicaldeposition AT patrickjshamberger thickfilmni05mn05xsnxheusleralloysbymultilayerelectrochemicaldeposition |
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