Three-dimensional measurement of object surface by using ellipse binary defocusing projection
Abstract Background The accuracy of three-dimensional measurement of object surface is always affected by the nonlinear gamma of the projector. The defocusing binary projection can overcome the nonlinear gamma distortion of the projector and reduce the effect of high harmonics without gamma calibrat...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
SpringerOpen
2017-10-01
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| Series: | Journal of the European Optical Society-Rapid Publications |
| Subjects: | |
| Online Access: | http://link.springer.com/article/10.1186/s41476-017-0055-7 |