Properties of Hafnium and Aluminium Silicates Coatings Obtained by PLD
We report on the deposition and characterization of hafnium silicate and aluminium silicate thin films for different applications in optics and electronics. Pulsed laser deposition in a controllable oxygen atmosphere was used as a processing technique, with optimized parameters in terms of laser wav...
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doaj-c6d87eaadba5414faf7da8b3b85892952021-07-23T13:35:56ZengMDPI AGCoatings2079-64122021-06-011175375310.3390/coatings11070753Properties of Hafnium and Aluminium Silicates Coatings Obtained by PLDEduard N. Sirjita0Laurentiu Rusen1Simona Brajnicov2Cristina Craciun3Valentin Ion4Mihaela Filipescu5Maria Dinescu6National Institute for Lasers, Plasma and Radiation Physics, 409 Atomistilor Street, 077125 Magurele, RomaniaNational Institute for Lasers, Plasma and Radiation Physics, 409 Atomistilor Street, 077125 Magurele, RomaniaNational Institute for Lasers, Plasma and Radiation Physics, 409 Atomistilor Street, 077125 Magurele, RomaniaNational Institute for Lasers, Plasma and Radiation Physics, 409 Atomistilor Street, 077125 Magurele, RomaniaNational Institute for Lasers, Plasma and Radiation Physics, 409 Atomistilor Street, 077125 Magurele, RomaniaNational Institute for Lasers, Plasma and Radiation Physics, 409 Atomistilor Street, 077125 Magurele, RomaniaNational Institute for Lasers, Plasma and Radiation Physics, 409 Atomistilor Street, 077125 Magurele, RomaniaWe report on the deposition and characterization of hafnium silicate and aluminium silicate thin films for different applications in optics and electronics. Pulsed laser deposition in a controllable oxygen atmosphere was used as a processing technique, with optimized parameters in terms of laser wavelength, laser fluence and oxygen pressure. The thin films were investigated using atomic force microscopy, spectroscopic ellipsometry, UV–VIS spectroscopy and X-ray photoelectron spectroscopy. The morphological investigations evidenced uniform layers with low roughness (in the order of nanometres). The optical investigations revealed that aluminium silicate layers with low roughness and low absorption in the infrared (IR) range can be obtained at high substrate temperatures (600 °C). The behaviour of the silicate thin films with respect to the nanosecond IR laser irradiation revealed that aluminium silicate layers have higher laser-induced damage threshold values in comparison with hafnium silicate.https://www.mdpi.com/2079-6412/11/7/753PLDhafnium silicatealuminium silicatecoatingLIDT |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Eduard N. Sirjita Laurentiu Rusen Simona Brajnicov Cristina Craciun Valentin Ion Mihaela Filipescu Maria Dinescu |
spellingShingle |
Eduard N. Sirjita Laurentiu Rusen Simona Brajnicov Cristina Craciun Valentin Ion Mihaela Filipescu Maria Dinescu Properties of Hafnium and Aluminium Silicates Coatings Obtained by PLD Coatings PLD hafnium silicate aluminium silicate coating LIDT |
author_facet |
Eduard N. Sirjita Laurentiu Rusen Simona Brajnicov Cristina Craciun Valentin Ion Mihaela Filipescu Maria Dinescu |
author_sort |
Eduard N. Sirjita |
title |
Properties of Hafnium and Aluminium Silicates Coatings Obtained by PLD |
title_short |
Properties of Hafnium and Aluminium Silicates Coatings Obtained by PLD |
title_full |
Properties of Hafnium and Aluminium Silicates Coatings Obtained by PLD |
title_fullStr |
Properties of Hafnium and Aluminium Silicates Coatings Obtained by PLD |
title_full_unstemmed |
Properties of Hafnium and Aluminium Silicates Coatings Obtained by PLD |
title_sort |
properties of hafnium and aluminium silicates coatings obtained by pld |
publisher |
MDPI AG |
series |
Coatings |
issn |
2079-6412 |
publishDate |
2021-06-01 |
description |
We report on the deposition and characterization of hafnium silicate and aluminium silicate thin films for different applications in optics and electronics. Pulsed laser deposition in a controllable oxygen atmosphere was used as a processing technique, with optimized parameters in terms of laser wavelength, laser fluence and oxygen pressure. The thin films were investigated using atomic force microscopy, spectroscopic ellipsometry, UV–VIS spectroscopy and X-ray photoelectron spectroscopy. The morphological investigations evidenced uniform layers with low roughness (in the order of nanometres). The optical investigations revealed that aluminium silicate layers with low roughness and low absorption in the infrared (IR) range can be obtained at high substrate temperatures (600 °C). The behaviour of the silicate thin films with respect to the nanosecond IR laser irradiation revealed that aluminium silicate layers have higher laser-induced damage threshold values in comparison with hafnium silicate. |
topic |
PLD hafnium silicate aluminium silicate coating LIDT |
url |
https://www.mdpi.com/2079-6412/11/7/753 |
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AT eduardnsirjita propertiesofhafniumandaluminiumsilicatescoatingsobtainedbypld AT laurentiurusen propertiesofhafniumandaluminiumsilicatescoatingsobtainedbypld AT simonabrajnicov propertiesofhafniumandaluminiumsilicatescoatingsobtainedbypld AT cristinacraciun propertiesofhafniumandaluminiumsilicatescoatingsobtainedbypld AT valentinion propertiesofhafniumandaluminiumsilicatescoatingsobtainedbypld AT mihaelafilipescu propertiesofhafniumandaluminiumsilicatescoatingsobtainedbypld AT mariadinescu propertiesofhafniumandaluminiumsilicatescoatingsobtainedbypld |
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