The Software Reliability of Large Scale Integration Circuit and Very Large Scale Integration Circuit

The Software Reliability of Large Scale Integration Circuit and Very Large Scale Integration Circuit

This article describes evaluation method of faultless function of large scale integration circuits (LSI) and very large scale integration circuits (VLSI). In the article there is a comparative analysis of factors which determine faultless of integrated circuits, analysis of already existing methods...

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Bibliographic Details
Main Authors: Artem Ganiyev, Jan Vitasek
Format: Article
Language:English
Published: VSB-Technical University of Ostrava 2010-01-01
Series:Advances in Electrical and Electronic Engineering
Subjects:
large scale integration circuit
very large scale integration circuit
integrated circuit
memory component
program equipment
telecommunication system.
Online Access:http://advances.utc.sk/index.php/AEEE/article/view/27

Internet

http://advances.utc.sk/index.php/AEEE/article/view/27

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