The Software Reliability of Large Scale Integration Circuit and Very Large Scale Integration Circuit

• Main Authors: Artem Ganiyev, Jan Vitasek
• Format: Article
• Language: English
• Published: VSB-Technical University of Ostrava 2010-01-01
• Series: Advances in Electrical and Electronic Engineering
• Subjects: large scale integration circuit; very large scale integration circuit; integrated circuit; memory component; program equipment; telecommunication system.
• Online Access: http://advances.utc.sk/index.php/AEEE/article/view/27

This article describes evaluation method of faultless function of large scale integration circuits (LSI) and very large scale integration circuits (VLSI). In the article there is a comparative analysis of factors which determine faultless of integrated circuits, analysis of already existing methods and model of faultless function evaluation of LSI and VLSI. The main part describes a proposed algorithm and program for analysis of fault rate in LSI and VLSI circuits.