Modeling and Simulation of Non-Contact Base Excited AFM
AFM has some unique properties such as higher spatial resolution, mapping even a single molecule, simple sample preparation, scanning in different types of medium, and can obtain a 3D scan of the sample surface. Therefore, with the help of AFM, one can obtain a unique understanding of the structure...
Main Author: | Bahrami Mohammad Reza |
---|---|
Format: | Article |
Language: | English |
Published: |
EDP Sciences
2021-01-01
|
Series: | E3S Web of Conferences |
Online Access: | https://www.e3s-conferences.org/articles/e3sconf/pdf/2021/61/e3sconf_abr2021_07035.pdf |
Similar Items
-
Studies of Field-Induced Oxidation by Non-Contact AFM
by: Hung Tzung-Yu, et al.
Published: (2000) -
Control of AFMs in contact mode
by: El-Rifai, Khalid, 1979-
Published: (2005) -
Non-contact atomic force microscope: Modeling and simulation using van der Pol averaging method
by: Bahrami, Mohammad Reza
Published: (2021-05-01) -
On the control of bistability in non-contact mode AFM using modulated time delay
by: Kirrou I., et al.
Published: (2014-01-01) -
Application of contact-resonance AFM methods to polymer samples
by: Sebastian Friedrich, et al.
Published: (2020-11-01)