Vanadium-Oxide-Based Thin Films with Ultra-High Thermo-Optic Coefficients at 1550 nm and 2000 nm Wavelengths

Vanadium-Oxide-Based Thin Films with Ultra-High Thermo-Optic Coefficients at 1550 nm and 2000 nm Wavelengths

In this paper, the temperature-dependent dielectric properties of vanadium-sesquioxide-based thin films are studied to assess their suitability for thermally tunable filters at optical communication wavelengths. Spectroscopic ellipsometry is utilized to measure the optical constants of vanadium oxid...

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Bibliographic Details
Main Authors: Mohamed Abdel-Rahman, Esam Bahidra, Ahmed Fauzi Abas
Format: Article
Language:English
Published: MDPI AG 2020-04-01
Series:Materials
Subjects:
vanadium sesquioxide
thin film
thermo-optic coefficient
infrared ellipsometry
optical constants
Online Access:https://www.mdpi.com/1996-1944/13/8/2002
Description
Summary:In this paper, the temperature-dependent dielectric properties of vanadium-sesquioxide-based thin films are studied to assess their suitability for thermally tunable filters at optical communication wavelengths. Spectroscopic ellipsometry is utilized to measure the optical constants of vanadium oxide thin films at temperatures ranging from 25 °C to 65 °C. High thermo-optic coefficients (<i>dn</i>/<i>dT</i>s) were observed. The highest <i>dn</i>/<i>dT</i>s, measured at approximately 40 °C, were −8.4 × 10<sup>−3</sup>/°C and −1.05 × 10<sup>−2</sup>/°C at 1550 nm and 2000 nm, respectively.
ISSN:1996-1944

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