The Inversion Layer Evolution According to the Report of Substrat Doping /Gate Doping of a MSP OS Structure
The inversion layer in the sample containing MOS structure is a very significant parameter for the operation of these components. In this question we summons it self interested in the simulation of the capacitance of MSPOS structure. We propose a numerical model, based on the resolution of the Poiss...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
IFSA Publishing, S.L.
2014-05-01
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| Series: | Sensors & Transducers |
| Subjects: | |
| Online Access: | http://www.sensorsportal.com/HTML/DIGEST/may_2014/Special_issue/P_SI_491.pdf |