ABOUT TECHNOLOGIES OF X-RAY SYSTEMS FOR CONTROL OF ELECTRONIC COMPONENTS
Introduction. X-ray methods are currently widely used in manufacturing of various products and components of the electronics industry, including micro- and nano-electronics. One of the most informative and illustrative methods is projection X-ray microscopy. Specialized X-ray systems for process con...
Main Authors: | Anatoly I. Mazurov, Nikolay N. Potrakhov |
---|---|
Format: | Article |
Language: | Russian |
Published: |
Saint Petersburg Electrotechnical University "LETI"
2019-07-01
|
Series: | Известия высших учебных заведений России: Радиоэлектроника |
Subjects: | |
Online Access: | https://re.eltech.ru/jour/article/view/330 |
Similar Items
-
LIGA METHOD OF FORMING HIGH-CONTRAST COLLIMATORS AND ANTI-SCATTER GRIDS WITH HIGH ASPECT RATIO
by: B.G. Goldenberg, et al.
Published: (2018-02-01) -
RADIATION LOAD IN THE PROCESS OF X-RAY DIAGNOSTICS WITH THE USE OF MICROFOCUS METHODS
by: N. N. Potrakhov, et al.
Published: (2017-02-01) -
Characterization of Osteoarthritis in a Medial Meniscectomy-Induced Animal Model Using Contrast-Enhanced X-ray Microtomography
by: Takehito Sugasawa, et al.
Published: (2020-03-01) -
Acquisition of Quasi-Monochromatic Dual-Energy in a Microfocus X-ray Generator and Development of Applied Technology
by: Hiroaki Hasegawa, et al.
Published: (2019-03-01) -
Scanning electron microscopy as a method for sample visualization in protein X-ray crystallography
by: Emma V. Beale, et al.
Published: (2020-05-01)