PREDICTION OF INFORMATION STORAGE TIME AFTER POWER OFF FOR INTEGRATED CIRCUITS OF EEPROM

PREDICTION OF INFORMATION STORAGE TIME AFTER POWER OFF FOR INTEGRATED CIRCUITS OF EEPROM

For crystals of EEPROM integrated circuits (ICs) a method for predicting of information storage time after the power is turned off is provided. Prediction is performed using the accelerated tests, which are considered as the temperature effects that accompany the technological operations in the prem...

Full description

Bibliographic Details
Main Authors: V. I. Plebanovich, S. M. Borovikov, E. N. Shneiderov, I. A. Burak
Format: Article
Language:Russian
Published: Educational institution «Belarusian State University of Informatics and Radioelectronics» 2019-06-01
Series:Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki
Subjects:
integrated circuits
eeprom
information storage time
power is turned off
Online Access:https://doklady.bsuir.by/jour/article/view/809

Similar Items

Similar Items