Effort-aware and just-in-time defect prediction with neural network.
Effort-aware just-in-time (JIT) defect prediction is to rank source code changes based on the likelihood of detects as well as the effort to inspect such changes. Accurate defect prediction algorithms help to find more defects with limited effort. To improve the accuracy of defect prediction, in thi...
Main Authors: | Lei Qiao, Yan Wang |
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Format: | Article |
Language: | English |
Published: |
Public Library of Science (PLoS)
2019-01-01
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Series: | PLoS ONE |
Online Access: | https://doi.org/10.1371/journal.pone.0211359 |
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