Motion Analysis of A Low Cost Customized A-Scan Non Destructive Testing Unit
This study introduced a new design of a low-cost customized A-scan Non Destructive Testing (NDT) unit using microcontroller-based scanning motion. the scanning unit from previous research has limitations in scanning envelope area and ability of detection. It can only detect large defects. To solve t...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2018-01-01
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| Series: | MATEC Web of Conferences |
| Subjects: | |
| Online Access: | https://doi.org/10.1051/matecconf/201821704002 |