Oxide Nanolayers in Stratified Samples Studied by X-Ray Resonant Raman Scattering at Grazing Incidence
X-ray resonant Raman scattering is applied at grazing incidence conditions with the aim of discriminating and identifying chemical environment of iron in different layers of stratified materials using a low resolution energy dispersive system. The methodology allows for depth studies with nanometric...
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Online Access: | http://dx.doi.org/10.1155/2015/618279 |
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doaj-c1f9bd00499b447aa4c20e9dd01268692020-11-24T23:22:21ZengHindawi LimitedJournal of Spectroscopy2314-49202314-49392015-01-01201510.1155/2015/618279618279Oxide Nanolayers in Stratified Samples Studied by X-Ray Resonant Raman Scattering at Grazing IncidenceJuan José Leani0Héctor Jorge Sánchez1Carlos Alberto Pérez2Facultad de Matemática Astronomía y Física, Universidad Nacional de Córdoba, 5000 Córdoba, ArgentinaFacultad de Matemática Astronomía y Física, Universidad Nacional de Córdoba, 5000 Córdoba, ArgentinaLaboratorio Nacional de Luz Síncrotron, CP 6192, 13084-971 Campinas, BrazilX-ray resonant Raman scattering is applied at grazing incidence conditions with the aim of discriminating and identifying chemical environment of iron in different layers of stratified materials using a low resolution energy dispersive system. The methodology allows for depth studies with nanometric resolution. Nanostratified samples of Fe oxides were studied at the Brazilian synchrotron facility (LNLS) using monochromatic radiation and an EDS setup. The measurements were carried out in grazing incident regime with incident photon energy lower than and close to the Fe-K absorption edge. The result allowed for characterizing oxide nanolayers, not observable with conventional geometries, identifying the oxidation state present in a particular depth of a sample surface with nanometric, or even subnanometric, resolution using a low-resolution system.http://dx.doi.org/10.1155/2015/618279 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Juan José Leani Héctor Jorge Sánchez Carlos Alberto Pérez |
spellingShingle |
Juan José Leani Héctor Jorge Sánchez Carlos Alberto Pérez Oxide Nanolayers in Stratified Samples Studied by X-Ray Resonant Raman Scattering at Grazing Incidence Journal of Spectroscopy |
author_facet |
Juan José Leani Héctor Jorge Sánchez Carlos Alberto Pérez |
author_sort |
Juan José Leani |
title |
Oxide Nanolayers in Stratified Samples Studied by X-Ray Resonant Raman Scattering at Grazing Incidence |
title_short |
Oxide Nanolayers in Stratified Samples Studied by X-Ray Resonant Raman Scattering at Grazing Incidence |
title_full |
Oxide Nanolayers in Stratified Samples Studied by X-Ray Resonant Raman Scattering at Grazing Incidence |
title_fullStr |
Oxide Nanolayers in Stratified Samples Studied by X-Ray Resonant Raman Scattering at Grazing Incidence |
title_full_unstemmed |
Oxide Nanolayers in Stratified Samples Studied by X-Ray Resonant Raman Scattering at Grazing Incidence |
title_sort |
oxide nanolayers in stratified samples studied by x-ray resonant raman scattering at grazing incidence |
publisher |
Hindawi Limited |
series |
Journal of Spectroscopy |
issn |
2314-4920 2314-4939 |
publishDate |
2015-01-01 |
description |
X-ray resonant Raman scattering is applied at grazing incidence conditions with the aim of discriminating and identifying chemical environment of iron in different layers of stratified materials using a low resolution energy dispersive system. The methodology allows for depth studies with nanometric resolution. Nanostratified samples of Fe oxides were studied at the Brazilian synchrotron facility (LNLS) using monochromatic radiation and an EDS setup. The measurements were carried out in grazing incident regime with incident photon energy lower than and close to the Fe-K absorption edge. The result allowed for characterizing oxide nanolayers, not observable with conventional geometries, identifying the oxidation state present in a particular depth of a sample surface with nanometric, or even subnanometric, resolution using a low-resolution system. |
url |
http://dx.doi.org/10.1155/2015/618279 |
work_keys_str_mv |
AT juanjoseleani oxidenanolayersinstratifiedsamplesstudiedbyxrayresonantramanscatteringatgrazingincidence AT hectorjorgesanchez oxidenanolayersinstratifiedsamplesstudiedbyxrayresonantramanscatteringatgrazingincidence AT carlosalbertoperez oxidenanolayersinstratifiedsamplesstudiedbyxrayresonantramanscatteringatgrazingincidence |
_version_ |
1725568308591198208 |