Oxide Nanolayers in Stratified Samples Studied by X-Ray Resonant Raman Scattering at Grazing Incidence

X-ray resonant Raman scattering is applied at grazing incidence conditions with the aim of discriminating and identifying chemical environment of iron in different layers of stratified materials using a low resolution energy dispersive system. The methodology allows for depth studies with nanometric...

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Main Authors: Juan José Leani, Héctor Jorge Sánchez, Carlos Alberto Pérez
Format: Article
Language:English
Published: Hindawi Limited 2015-01-01
Series:Journal of Spectroscopy
Online Access:http://dx.doi.org/10.1155/2015/618279
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spelling doaj-c1f9bd00499b447aa4c20e9dd01268692020-11-24T23:22:21ZengHindawi LimitedJournal of Spectroscopy2314-49202314-49392015-01-01201510.1155/2015/618279618279Oxide Nanolayers in Stratified Samples Studied by X-Ray Resonant Raman Scattering at Grazing IncidenceJuan José Leani0Héctor Jorge Sánchez1Carlos Alberto Pérez2Facultad de Matemática Astronomía y Física, Universidad Nacional de Córdoba, 5000 Córdoba, ArgentinaFacultad de Matemática Astronomía y Física, Universidad Nacional de Córdoba, 5000 Córdoba, ArgentinaLaboratorio Nacional de Luz Síncrotron, CP 6192, 13084-971 Campinas, BrazilX-ray resonant Raman scattering is applied at grazing incidence conditions with the aim of discriminating and identifying chemical environment of iron in different layers of stratified materials using a low resolution energy dispersive system. The methodology allows for depth studies with nanometric resolution. Nanostratified samples of Fe oxides were studied at the Brazilian synchrotron facility (LNLS) using monochromatic radiation and an EDS setup. The measurements were carried out in grazing incident regime with incident photon energy lower than and close to the Fe-K absorption edge. The result allowed for characterizing oxide nanolayers, not observable with conventional geometries, identifying the oxidation state present in a particular depth of a sample surface with nanometric, or even subnanometric, resolution using a low-resolution system.http://dx.doi.org/10.1155/2015/618279
collection DOAJ
language English
format Article
sources DOAJ
author Juan José Leani
Héctor Jorge Sánchez
Carlos Alberto Pérez
spellingShingle Juan José Leani
Héctor Jorge Sánchez
Carlos Alberto Pérez
Oxide Nanolayers in Stratified Samples Studied by X-Ray Resonant Raman Scattering at Grazing Incidence
Journal of Spectroscopy
author_facet Juan José Leani
Héctor Jorge Sánchez
Carlos Alberto Pérez
author_sort Juan José Leani
title Oxide Nanolayers in Stratified Samples Studied by X-Ray Resonant Raman Scattering at Grazing Incidence
title_short Oxide Nanolayers in Stratified Samples Studied by X-Ray Resonant Raman Scattering at Grazing Incidence
title_full Oxide Nanolayers in Stratified Samples Studied by X-Ray Resonant Raman Scattering at Grazing Incidence
title_fullStr Oxide Nanolayers in Stratified Samples Studied by X-Ray Resonant Raman Scattering at Grazing Incidence
title_full_unstemmed Oxide Nanolayers in Stratified Samples Studied by X-Ray Resonant Raman Scattering at Grazing Incidence
title_sort oxide nanolayers in stratified samples studied by x-ray resonant raman scattering at grazing incidence
publisher Hindawi Limited
series Journal of Spectroscopy
issn 2314-4920
2314-4939
publishDate 2015-01-01
description X-ray resonant Raman scattering is applied at grazing incidence conditions with the aim of discriminating and identifying chemical environment of iron in different layers of stratified materials using a low resolution energy dispersive system. The methodology allows for depth studies with nanometric resolution. Nanostratified samples of Fe oxides were studied at the Brazilian synchrotron facility (LNLS) using monochromatic radiation and an EDS setup. The measurements were carried out in grazing incident regime with incident photon energy lower than and close to the Fe-K absorption edge. The result allowed for characterizing oxide nanolayers, not observable with conventional geometries, identifying the oxidation state present in a particular depth of a sample surface with nanometric, or even subnanometric, resolution using a low-resolution system.
url http://dx.doi.org/10.1155/2015/618279
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AT hectorjorgesanchez oxidenanolayersinstratifiedsamplesstudiedbyxrayresonantramanscatteringatgrazingincidence
AT carlosalbertoperez oxidenanolayersinstratifiedsamplesstudiedbyxrayresonantramanscatteringatgrazingincidence
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