Low Side Gan Fet Driver for Space Applications

Low Side Gan Fet Driver for Space Applications

This paper reports the results of preliminary single event effects (SEE) testing of the Intersil ISL70040SEH, a single low side driver specifically designed to drive enhancement mode power GaN FETs.

Bibliographic Details
Main Authors:	Mansilla O. E., Broline J., Satterfied H., Pearce L. G., Thomson E. J.
Format:	Article
Language:	English
Published:	EDP Sciences 2017-01-01
Series:	E3S Web of Conferences
Online Access:	https://doi.org/10.1051/e3sconf/20171612006

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