Observations on Nanoscale Te Precipitates in CdZnTe Crystals Grown by the Traveling Heater Method Using High Resolution Transmission Electron Microscopy

Observations on Nanoscale Te Precipitates in CdZnTe Crystals Grown by the Traveling Heater Method Using High Resolution Transmission Electron Microscopy

Te precipitates in CdZnTe (CZT) crystals grown by the traveling heater method (THM) are investigated using high-resolution transmission electron microscopy (HRTEM). The results show that in THM-grown CZT crystals, Te precipitates are less than 10 nm in size—much smaller than those in Bridgman-grown...

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Bibliographic Details
Main Authors: Boru Zhou, Wanqi Jie, Tao Wang, Zongde Kou, Dou Zhao, Liying Yin, Fan Yang, Shouzhi Xi, Gangqiang Zha, Ziang Yin
Format: Article
Language:English
Published: MDPI AG 2018-01-01
Series:Crystals
Subjects:
transmission electron microscopy (TEM)
traveling heater method
precipitation
interface structure
defects in semiconductors
CdZnTe
Online Access:http://www.mdpi.com/2073-4352/8/1/26

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