Observations on Nanoscale Te Precipitates in CdZnTe Crystals Grown by the Traveling Heater Method Using High Resolution Transmission Electron Microscopy

• Main Authors: Boru Zhou, Wanqi Jie, Tao Wang, Zongde Kou, Dou Zhao, Liying Yin, Fan Yang, Shouzhi Xi, Gangqiang Zha, Ziang Yin
• Format: Article
• Language: English
• Published: MDPI AG 2018-01-01
• Series: Crystals
• Subjects: transmission electron microscopy (TEM); traveling heater method; precipitation; interface structure; defects in semiconductors; CdZnTe
• Online Access: http://www.mdpi.com/2073-4352/8/1/26

Te precipitates in CdZnTe (CZT) crystals grown by the traveling heater method (THM) are investigated using high-resolution transmission electron microscopy (HRTEM). The results show that in THM-grown CZT crystals, Te precipitates are less than 10 nm in size—much smaller than those in Bridgman-grown CZT. They have hexagonal structure and form a coherent interface with zinc blend structure CZT matrix in the orientation relationship [ 1 ¯ 12 ] M / / [ 0001 ] P and ( 1 1 ¯ 1 ) M / / ( 1 ¯ 100 ) P . A ledge growth interface with the preferred orientation along the [ 1 1 ¯ 1 ] M and [ 110 ] M was found near Te precipitates. The growth and nucleation mechanism of Te precipitates are also discussed.