The comprehensive study of the thermal etching conditions for partially and fully dense ceramic samples
An alternative approach to the thermal etching of oxide ceramic materials (α- alumina, t-zirconia, and c-zirconia) is presented and compared with the standardly used regime for thermal etching. The given approach was tested on partially (93.8 - 96.3 % t.d.) and fully (99 - 100 % t.d.) dense...
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International Institute for the Science of Sintering, Beograd
2019-01-01
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doaj-bf0e1bcb3c09404da413e0403375de532020-11-24T22:00:29ZengInternational Institute for the Science of Sintering, BeogradScience of Sintering0350-820X1820-74132019-01-0151325726410.2298/SOS1903257S0350-820X1903257SThe comprehensive study of the thermal etching conditions for partially and fully dense ceramic samplesSpusta Tomáš0Jemelka Marek1Maca Karel2CEITEC BUT, Brno University of Technology, Brno, Czech Republic + Faculty of Mechanical Engineering, Brno University of Technology, Brno, Czech RepublicCEITEC BUT, Brno University of Technology, Brno, Czech Republic + Faculty of Mechanical Engineering, Brno University of Technology, Brno, Czech RepublicCEITEC BUT, Brno University of Technology, Brno, Czech Republic + Faculty of Mechanical Engineering, Brno University of Technology, Brno, Czech RepublicAn alternative approach to the thermal etching of oxide ceramic materials (α- alumina, t-zirconia, and c-zirconia) is presented and compared with the standardly used regime for thermal etching. The given approach was tested on partially (93.8 - 96.3 % t.d.) and fully (99 - 100 % t.d.) dense samples with the criterion of minimizing the density difference after and before etching and with the criterion of clear visibility of grain boundaries. The presented results show, that 900°C/1 h etching regime is sufficient to reveal the studied microstructure for analysis of the surface of the samples sintered above 1355°C without affecting the density and without thermal effect on the measured average grain size. The modern approaches as digital analysis of the images can help to reveal the thin grain boundaries after thermal etching at low temperatures.http://www.doiserbia.nb.rs/img/doi/0350-820X/2019/0350-820X1903257S.pdfthermal etchingoxide materialsalternative approachlow temperature |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Spusta Tomáš Jemelka Marek Maca Karel |
spellingShingle |
Spusta Tomáš Jemelka Marek Maca Karel The comprehensive study of the thermal etching conditions for partially and fully dense ceramic samples Science of Sintering thermal etching oxide materials alternative approach low temperature |
author_facet |
Spusta Tomáš Jemelka Marek Maca Karel |
author_sort |
Spusta Tomáš |
title |
The comprehensive study of the thermal etching conditions for partially and fully dense ceramic samples |
title_short |
The comprehensive study of the thermal etching conditions for partially and fully dense ceramic samples |
title_full |
The comprehensive study of the thermal etching conditions for partially and fully dense ceramic samples |
title_fullStr |
The comprehensive study of the thermal etching conditions for partially and fully dense ceramic samples |
title_full_unstemmed |
The comprehensive study of the thermal etching conditions for partially and fully dense ceramic samples |
title_sort |
comprehensive study of the thermal etching conditions for partially and fully dense ceramic samples |
publisher |
International Institute for the Science of Sintering, Beograd |
series |
Science of Sintering |
issn |
0350-820X 1820-7413 |
publishDate |
2019-01-01 |
description |
An alternative approach to the thermal etching of oxide ceramic materials
(α- alumina, t-zirconia, and c-zirconia) is presented and compared with the
standardly used regime for thermal etching. The given approach was tested on
partially (93.8 - 96.3 % t.d.) and fully (99 - 100 % t.d.) dense samples
with the criterion of minimizing the density difference after and before
etching and with the criterion of clear visibility of grain boundaries. The
presented results show, that 900°C/1 h etching regime is sufficient to
reveal the studied microstructure for analysis of the surface of the samples
sintered above 1355°C without affecting the density and without thermal
effect on the measured average grain size. The modern approaches as digital
analysis of the images can help to reveal the thin grain boundaries after
thermal etching at low temperatures. |
topic |
thermal etching oxide materials alternative approach low temperature |
url |
http://www.doiserbia.nb.rs/img/doi/0350-820X/2019/0350-820X1903257S.pdf |
work_keys_str_mv |
AT spustatomas thecomprehensivestudyofthethermaletchingconditionsforpartiallyandfullydenseceramicsamples AT jemelkamarek thecomprehensivestudyofthethermaletchingconditionsforpartiallyandfullydenseceramicsamples AT macakarel thecomprehensivestudyofthethermaletchingconditionsforpartiallyandfullydenseceramicsamples AT spustatomas comprehensivestudyofthethermaletchingconditionsforpartiallyandfullydenseceramicsamples AT jemelkamarek comprehensivestudyofthethermaletchingconditionsforpartiallyandfullydenseceramicsamples AT macakarel comprehensivestudyofthethermaletchingconditionsforpartiallyandfullydenseceramicsamples |
_version_ |
1725844277046542336 |